CAREER: Computer Aided Design Tools for Fault-Tolerant and Highly-Reliable Scalable VLSI Systems

这项研究是发展的基本思想和技术，设计容错和高可靠性的系统在寄存器传输级。在当今和未来的技术中，故障机制有很多，包括：制造点缺陷，热电子效应，串扰和电迁移。在这个项目中，研究人员 正在探索在系统设计过程的寄存器传输阶段进行容错设计和可靠性设计的技术。也正在解决的是容错增强和可靠性提高的基础上的统计数据和物理的目标故障的设计方法。最后，正在开发设计容错和可靠超大规模集成电路系统的软件工具，并将纳入现有的CAD系统。 这些研究成果正在纳入课程。

This research is on developing fundamental ideas and techniques for designing fault-tolerant and highly reliable systems at the register-transfer level. In today's and future technologies failure mechanisms are many, including: manufacturing spot defects, hot electron effects, crosstalk and electro-migration. In this project, the investigator is exploring techniques for design-for-fault-tolerance and design-for-reliability during the register-transfer phase of a system design process. Also being addressed are design methodologies for fault-tolerance enhancement and reliability improvement based on the statistics and physics of the targeted failures. Finally, software tools for the design of fault-tolerant and reliable VLSI systems are being developed and will be incorporated into existing CAD systems. These research results are being integrated into the curriculum.