POWRE: Imaging Near-Contact Transport in High Resistivity Semiconductors

这个项目的目标是将微分析光学和电子技术与特别设计的平面接触结构结合起来，在接触附近和小型半导体结构上进行图像传输。在扫描电子显微镜下进行电子束感应电流（EBIC）和阴极发光（CL）的定量测量。这些测量结果有望反映在局部电场和触点附近载流子剖面偏压下的空间分布和变化。这是在研究和教育领域妇女专业机会（POWRE）计划下提供的一项研究加强补助金。该研究将在基础水平上提供基础材料科学知识。该计划的一个重要特点是通过本科生参与研究，将研究与教育相结合。＊＊＊

9720485 Haegel The goal of this project is to combine microanalysis optical and electrical techniques with specially designed planar contact structures to image transport near contacts and on small semiconductor structures. Quantitative electron beam induced current (EBIC) and cathodoluminescence (CL) measurements will be made in a scanning electron microscope. These measurements are expected to reflect spatial distributions and changes under bias of local electric fields and carrier profiles near the contacts. %%% This is a research enhancement grant made under the Professional Opportunities for Women in Research and Education (POWRE) program. The research will contribute basic materials science knowledge at a fundamental level. An important feature of the program is the integration of research and education through undergraduate student participation in research. ***