POWRE: Imaging Near-Contact Transport in High Resistivity Semiconductors

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9720485 Haegel The goal of this project is to combine microanalysis optical and electrical techniques with specially designed planar contact structures to image transport near contacts and on small semiconductor structures. Quantitative electron beam induced current (EBIC) and cathodoluminescence (CL) measurements will be made in a scanning electron microscope. These measurements are expected to reflect spatial distributions and changes under bias of local electric fields and carrier profiles near the contacts. %%% This is a research enhancement grant made under the Professional Opportunities for Women in Research and Education (POWRE) program. The research will contribute basic materials science knowledge at a fundamental level. An important feature of the program is the integration of research and education through undergraduate student participation in research. ***