The Fabrication and Physical Properties of Integrated Metal and Semiconductor Nanocrystal Systems

小行星9726597 这个FRG/GOALI项目是多学科的，涉及化学，物理，工程和材料科学的元素。 教授A。Paul Alivisatos和James R.加州大学洛杉矶分校和加州大学洛杉矶分校的希思分别与R。惠普实验室的斯坦利威廉姆斯。该项目的目的是通过首先开发适用于器件应用的NC基薄膜合成技术，并通过理解和优化NC/x界面的特性，为基于MEMS（NC）和MEMS阵列（NCA）的器件的演示和开发奠定基础。各种潜在的应用，从磷光体到光致发光材料到电子开关和存储设备，都可以预见到这些材料。这一做法涉及两个方面。第一个是开发将纳米晶体和纳米晶体组件集成到技术相关环境中的技术。第二个是发展综合系统如何运作的实际情况。将开发用于制造集成系统和检查其结构特性的化学技术。它们的光学性质将被询问与时间和频率分辨光谱。温度相关的电子传输，光伏，电容测量通过集成NC和NCA系统将进行使用电子束光刻产生的接触。将特别努力控制和描述这些不同系统中的接口。该项目由四个NSF项目和MPS OMA（多学科活动办公室）共同支持。 该项目解决了具有高技术相关性的科学和工程跨学科领域的前沿研究问题。 这项研究将为材料和设备的重要方面提供基础知识，并将提供更好的理解。 并为设计和生产未来设备的改进材料和结构奠定基础。 该计划的一个重要特点是通过在一个基本和技术上重要的领域对学生进行培训来整合研究和教育。 ***

9726597 Alivisatos This FRG/GOALI project is multidisciplinary, involving elements of Chemistry, Physics, Engineering and Materials Science. Professors A. Paul Alivisatos and James R. Heath at UCB and UCLA, respectively, are collaborating with R. Stanley Williams at Hewlett-Packard Laboratories. The aim of the project is to lay the groundwork for the demonstration and the development of nanocrystal(NC) and nanocrystal array(NCA) based devices by first developing techniques for synthesis of NC-based thin films appropriate for device applications, and by understanding and optimizing the properties of NC/x interfaces. A variety of potential applications, ranging from phosphors to photovoltaics to electronic switching and storage devices, are envisioned for these materials. The approach involves two aspects. The first is the development of techniques for integrating nanocrystals and nanocrystal assemblies into technologically relevant environments. The second is the development of a physical picture of how the integrated systems operate. Chemical techniques for fabricating nanocrystal integrated systems and examining their structural characteristics will be developed. Their optical properties will be interrogated with time and frequency resolved spectroscopies. Temperature dependent electron transport, photovoltaic, and capacitance measurements through integrated NC and NCA systems will be carried out using contacts produced by electron-beam lithography. Particular effort will be spent on controlling and characterizing the interfaces in these various systems. The project is co-supported by four NSF programs, and the MPS OMA(Office of Multidisciplinary Activities). %%% This project addresses forefront research issues in an interdisciplinary area of science and engineering having high technological relevance. The research will contribute basic knowledge at a fundamental level to important aspects of materials and devices, and will provide improved understanding and a basis for designing and producing improved materials and structures for devices of the future. An important feature of the program is the integration of research and education through the training of students in a fundamentally and technologically significant area. ***