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SBIR Phase I: Two-Wavelength Thermal Imaging Solutions to Materials Process Control Needs

SBIR Phase I: Two-Wavelength Thermal Imaging Solutions to Materials Process Control Needs
SBIR 第一阶段:满足材料过程控制需求的双波长热成像解决方案
批准号:
9860678
负责人:
James Craig
金额:
$10.0万
依托单位:
依托单位国家:
美国
项目类别:
Standard Grant
财政年份:
1999
资助国家:
美国
项目状态:
已结题
起止时间:
1999-01-01 至 1999-06-30

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中文摘要
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英文摘要
9860678 This Small Business Innovation Research (SBIR) Phase I project will investigate a two-wavelength imaging pyrometer, using an indium gallium sulfide (InGaS)-based camera, to monitor high-temperature materials processes. The innovative two-wavelength imaging uses intensity ratios to provide accurate temperature measurement of objects with emissivity variation. Single wavelength imaging sensors mistake absolute intensity changes, caused by emissivity variation, for temperature changes. Temperature is a central parameter in many forms of high-temperature materials processing. Temperature control over long production runs provides product consistency and uniformity at reduced manufacturing costs. Phase I will design and construct a prototype two-wavelength, imaging pyrometer with InGaS camera and perform laboratory evaluations and tests in materials processing facilities of selected industrial and research organizations. This thermal imaging sensor is expected to meet industrial needs for accuracy, high temperature operation, and low cost. The developed thermal imaging sensor, with its 1-2 micron sensitivity, will find wide application to industrial needs for process control sensors for high temperature materials processing.
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