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SBIR Phase II: Two-Wavelength Thermal Imaging Solutions to Materials Process Control Needs

SBIR Phase II: Two-Wavelength Thermal Imaging Solutions to Materials Process Control Needs
SBIR 第二阶段:满足材料过程控制需求的双波长热成像解决方案
批准号:
9983275
负责人:
James Craig
金额:
$39.98万
依托单位:
依托单位国家:
美国
项目类别:
Standard Grant
财政年份:
2000
资助国家:
美国
项目状态:
已结题
起止时间:
2000-07-15 至 2004-03-31

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中文摘要
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英文摘要
This Small Business Innovation Research (SBIR) Phase II project will develop a prototype two-wavelengthimaging pyrometer. To monitor high-temperature materials processes, it uses an indium gallium arsenide (InGaAs)-based camera. Two-wavelength imaging uses intensity ratios to provide accurate temperature measurement of objects with emissivity variation. Single wavelength imaging sensors mistake absolute intensity changes, caused by emissivity variation, for temperature changes. Temperature is a central parameter in many high-temperature materials processese. Long production runs require temperature control for consistent product quality. This thermal imaging sensor is expected to meet industry needs for accuracy, low temperature operation, and low cost. Phase II will develop a 'research grade' imaging pyrometer for use in specialized laboratory experiments and a 'ruggedized grade' imaging pyrometer for testing in industrial facilities.Potential commercial applications of the thermal imaging sensor (with its 1-2 mm sensitivity) are expected in industrial process control sensors for high temperature materials processing.
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