Acquisition of X-ray Diffraction Instrumentation for Materials Science Research

9977193 Burns主要研究仪器计划的资金将用于购买X射线衍射仪器，包括一台配备初级光束光学器件的分析材料研究级衍射仪和一台配备双棱镜-低温恒温器附件和掠入射薄膜载物台的低分辨率衍射仪。 这种X射线仪器将用于表征先进的成像材料，包括光学和电子材料，薄膜，涂层和表面抛光或研磨的晶体材料。衍射仪是Philips Materials Research衍射仪和多用途衍射仪仪器。 提出了一种具有极高分辨率、水平测角仪和重型欧拉支架的材料研究衍射仪，该衍射仪具有织构分析、高角度残余应力分析、分层和面内MBE应变和结构分析的能力。 该设备的关键方面将是获得薄膜、分子束外延层、残余应力、研磨和抛光的晶体表面和织构分析的结构敏感数据的能力，这些数据今天在罗切斯特大学由于缺乏仪器而无法进行。 从这些分析中获得的数据对于理解和控制现有材料的微观结构、性能和性能以及设计新材料和工艺至关重要。 对该仪器进行的研究将由几个部门的研究人员进行。 参与该项目的学生将接触到具有重要技术意义的材料的前沿研究。材料研究的X射线衍射仪器将由重大研究仪器计划提供资金。 对罗切斯特大学研究基础设施的影响将是巨大的，不仅对将使用该仪器的项目类型，而且对学生在这个国家的最先进的系统的研究培训。

9977193BurnsFunds from the Major Research Instrumentation program will be used to acquire x-ray diffraction instrumentation consisting of an analytic materials research grade diffractometer fitted with primary beam optics and a lower resolution diffractometer outfitted with a dual furnace-cryostat attachment and a grazing incidence thin-film stage. This x-ray instrumentation will be used to characterize advanced imaging materials, including optical and electronic materials, thin films, coatings, and surface-polished or ground crystalline materials. The diffractometers are the Philips Materials Research Diffractometer and Multi-Purpose Diffractometer instruments. A materials research diffractometer with a very high resolution, horizontal goniometer and a heavy duty Eulerian cradle with capability for texture analysis, high-angle residual-stress analysis, layered and in-plane MBE strain and structure analysis are proposed. The key aspect of this equipment will be the capability to obtain structure sensitive data on thin-films, MBE layers, residual-stresses, ground and polished crystalline surfaces and texture analyses which can not be conducted at the University of Rochester today because of lack of instrumentation. Data obtained from these analyses is essential for understanding and controlling the microstructure, properties and performance of existing materials and to design new materials and processes. The research conducted on this instrument will be performed by investigators in several departments. Students working on these project will be exposed to cutting-edge research in materials of great technological importance.X-ray diffraction instrumentation for materials research will be acquired with funds from the Major Research Instrumentation program. The impact on the research infrastructure at the University of Rochester will be great not only on the types of projects that will use the instrument, but also on the research training of students on this state-of-the-art system.