CAREER: Variable Temperature Electric Force and Magnetic Resonance Force Microscopy Studies of Organic Electronic Materials

该项目旨在开发新的尖端仪器，作为促进对有机导体和半导体中掺杂和电荷传导的化学和物理机制的理解的工具。目标是增强对表面电荷进行量化和成像的能力，因为在宽范围的温度和压力下具有优于单个电子灵敏度的检测电荷将显著推进有机器件制造的科学和工程。另一个目标是探索测量亚毫微微牛顿力的可能性，并最终通过力显微镜进行单分子核磁共振成像。教育目标包括探索这项研究与化学为基础的材料科学的整合，旨在培养本科生，特别是工程师，并推广到幼儿园到12年级的学生。全硅技术的发展取决于硅/二氧化硅界面处固有的低电荷陷阱密度。有机器件中界面电荷陷阱的存在严重阻碍了高效有机晶体管型器件的发展。设计和使用可用于表征和去除这些电荷陷阱的工具将对有机基器件的商业化至关重要。在这些领域接受培训的学生将非常有效地竞争就业机会。

This project aims to develop new leading-edge instrumentation as tools for advancing the understanding of chemical and physical mechanisms of doping and charge conduction in organic conductors and semiconductors. The goal is to enhance the ability to quantify and image surface charge since the detecting charge with better than single electron sensitivity over a wide range of temperatures and pressures will significantly advance the science and engineering of organic device fabrication. Another goal is to explore the possibilities for measuring sub-femto Newton forces and ultimately single-molecule nuclear magnetic resonance imaging by force microscopy. The educational goals include exploring the integration of this research with chemistry-based materials science directed to training undergraduates, particularly engineers, and for outreach to Kindergarten through grade 12 students.%%%The development of all silicon technology hinges upon the inherently low charge trap density at the silicon / silicon dioxide interface. The presence of interface charge traps in organic devices has seriously retarded the development of high-efficiency organic transistor type devices. Designing and using tools that can be used to characterize and remove these charge traps will be crucial to the commercialization of organic based devices. Students trained in these areas will compete very effectively for job opportunities.