CAREER: Variable Temperature Electric Force and Magnetic Resonance Force Microscopy Studies of Organic Electronic Materials

该项目旨在开发新的前沿仪器，作为促进对有机导体和半导体中掺杂和电荷传导的化学和物理机制的理解的工具。其目的是提高表面电荷的量化和成像能力，因为在广泛的温度和压力范围内具有比单电子更好的灵敏度的探测电荷将大大促进有机器件制造的科学和工程。另一个目标是探索用力显微镜测量亚飞微牛顿力并最终测量单分子核磁共振成像的可能性。教育目标包括探索将这项研究与以化学为基础的材料科学相结合，旨在培训本科生，特别是工程师，并推广到幼儿园到12年级的学生。所有硅技术的发展取决于硅/二氧化硅界面固有的低电荷陷阱密度。有机器件中界面电荷陷阱的存在严重阻碍了高效率有机晶体管类型器件的发展。设计和使用可用于表征和消除这些电荷陷阱的工具将对基于有机的器件的商业化至关重要。在这些领域接受培训的学生将非常有效地竞争就业机会。

This project aims to develop new leading-edge instrumentation as tools for advancing the understanding of chemical and physical mechanisms of doping and charge conduction in organic conductors and semiconductors. The goal is to enhance the ability to quantify and image surface charge since the detecting charge with better than single electron sensitivity over a wide range of temperatures and pressures will significantly advance the science and engineering of organic device fabrication. Another goal is to explore the possibilities for measuring sub-femto Newton forces and ultimately single-molecule nuclear magnetic resonance imaging by force microscopy. The educational goals include exploring the integration of this research with chemistry-based materials science directed to training undergraduates, particularly engineers, and for outreach to Kindergarten through grade 12 students.%%%The development of all silicon technology hinges upon the inherently low charge trap density at the silicon / silicon dioxide interface. The presence of interface charge traps in organic devices has seriously retarded the development of high-efficiency organic transistor type devices. Designing and using tools that can be used to characterize and remove these charge traps will be crucial to the commercialization of organic based devices. Students trained in these areas will compete very effectively for job opportunities.