CRI: SEAT: Soft Error Analysis Toolset

CRI：SEAT：软错误分析工具集

• 批准号: 0454123
• 负责人: VIJAYKRISHNAN NARAYANAN
• 金额: $ 43.31万
• 依托单位: Pennsylvania State Univ University Park
• 依托单位国家: 美国
• 项目类别: Continuing Grant
• 财政年份: 2005
• 资助国家: 美国
• 起止时间: 2005-09-15 至 2009-08-31
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=0454123&HistoricalAwards=false
• 关键词: CRI; SEAT; Soft; Error; Analysis

AbstractProgram: NSF 04-588 CISE Computing Research InfrastructureTitle: CRI: SEAT: Soft Error Analysis Toolset Proposal: CNS-0454123 PI: Narayanan, Vijaykrishnan Institution: Pennsylvania State Univ University Park Project: Researchers at The Pennsylvania State University will develop the Soft Error Analysis Toolset (SEAT) and accompanying datasets as a community resource. Soft Errors are unwanted state changes in integrated circuits due to radiation such as cosmic rays. The investigators will have access to the Breazeale TRIGA nuclear research reactor at Penn State to gather actual data on radiation effects on devices such as microprocessors and FPGA's. In addition to experimental data gathering, the project will develop a toolset to model effects and support design at various levels: circuit analysis, logic analysis, and architecture analysis. These tools will be used in new courses in reliable design at Penn State. The data, tools and courses will be made available to other universities.

摘要程序图：NSF 04-588 CISE计算研究基础结构：CRI：座位：软错误分析工具集建议：CNS-0454123 PI：Narayanan，Vijaykrishnanan机构：宾夕法尼亚州立大学州立大学公园项目：宾夕法尼亚州立大学的研究人员，宾夕法尼亚州立大学的研究人员将（SEATNSSYLVANIA SATERESENS）（pennsylvania aster）工具（社区资源。软误差是由于辐射（例如宇宙射线）引起的综合电路的不良状态变化。研究人员将可以进入宾夕法尼亚州的Breazeale Triga核研究反应堆，以收集有关微处理器和FPGA等设备的辐射影响的实际数据。除了实验数据收集外，该项目还将开发一个工具集，以在各个层面上建模效应和支持设计：电路分析，逻辑分析和体系结构分析。这些工具将在宾夕法尼亚州可靠设计的新课程中使用。数据，工具和课程将提供给其他大学。