CSR---SMA: Characterizing, Modeling and Mitigating Soft Error Vulnerability in Multithreaded and Multi-core Execution Environments

CSR---SMA：描述、建模和缓解多线程和多核执行环境中的软错误漏洞

• 批准号: 0720476
• 负责人: Tao Li
• 金额: $ 5万
• 依托单位: University of Florida
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 2007
• 资助国家: 美国
• 起止时间: 2007-08-01 至 2009-07-31
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=0720476&HistoricalAwards=false
• 关键词: CSR; SMA; Characterizing; Modeling; Mitigating

Future microprocessors will consist of billions of nanoscale transistors organized as multi-core multithreaded microarchitectures. Since nano-sized transistors are sensitive to external events and manufacturing variabilities, there is a non-negligible probability of one or more faults occurring in one of billions of transistors and affecting one of many threads. High data-integrity and availability requirements make reliability as important for computers as performance, power consumption, and yield. This project studies techniques for characterizing and mathematically modeling the vulnerability of system-level components (i.e. at the microarchitecture, OS and program levels) to soft-errors.Today's design methodologies optimize the performance and power of multi-core and/or multithreaded architectures, but largely ignore reliability in the presence of soft errors. An important and urgent research task is to develop frameworks, models and techniques to characterize and estimate the deleterious impact of soft errors. This research addresses the above challenge by 1) developing a unified, reliability-aware simulation framework to quantify microarchitecture soft-error vulnerability of simultaneous-multithreading and multi-core systems consisting of a wide range of heterogeneous hardware and software components; and 2) creating fast and accurate analytical models to estimate and forecast soft-error vulnerabilities of hardware and software components without using lengthy and detailed simulations; Frameworks that can quantitatively study soft error vulnerability will enable reliability-aware designs and research for emerging simultaneous-multithreading and multi-core architectures. The PIs will use the concepts, tools, techniques and other results of this research project to introduce graduate and undergraduate students to the nature of soft errors and their impact on execution environments. These teaching activities will lead to improvements in courses on computer architecture, fault-tolerant computing and nanocomputing. The tools developed in this project are accessible and usable over the Web, using equipment and middleware developed by the PIs laboratory. This makes it straightforward for other academics and engineers to use them in their own work.

未来的微处理器将由数十亿个纳米级晶体管组成，这些晶体管被组织为多核多线程微架构。由于纳米级晶体管对外部事件和制造变异性很敏感，因此数十亿个晶体管之一中发生一个或多个故障并影响多个线程之一的可能性不可忽略。高数据完整性和可用性要求使得可靠性对于计算机来说与性能、功耗和产量一样重要。该项目研究对系统级组件（即微架构、操作系统和程序级别）对软错误的脆弱性进行表征和数学建模的技术。当今的设计方法优化了多核和/或多线程架构的性能和功能，但在很大程度上忽略了软错误存在时的可靠性。一项重要而紧迫的研究任务是开发框架、模型和技术来表征和估计软错误的有害影响。本研究通过以下方式解决了上述挑战：1）开发一个统一的、可靠性感知的模拟框架，以量化由各种异构硬件和软件组件组成的同时多线程和多核系统的微架构软错误漏洞； 2）创建快速准确的分析模型来估计和预测硬件和软件组件的软错误漏洞，而无需使用冗长且详细的模拟；能够定量研究软错误漏洞的框架将为新兴的同步多线程和多核架构提供可靠性感知设计和研究。 PI 将利用该研究项目的概念、工具、技术和其他成果，向研究生和本科生介绍软错误的本质及其对执行环境的影响。这些教学活动将改进计算机体系结构、容错计算和纳米计算等课程。该项目开发的工具可通过网络访问和使用，使用 PI 实验室开发的设备和中间件。这使得其他学者和工程师可以在自己的工作中轻松使用它们。