MRI: Acquisition of a High Resolution X-Ray Diffraction System for Materials Research at The City College of New York

MRI：纽约城市学院购买用于材料研究的高分辨率 X 射线衍射系统

• 批准号: 0923084
• 负责人: Maria Tamargo
• 金额: $ 47.5万
• 依托单位: CUNY City College
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 2009
• 资助国家: 美国
• 起止时间: 2009-10-01 至 2011-09-30
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=0923084&HistoricalAwards=false
• 关键词: MRI; Acquisition; Resolution; Ray; Diffraction

0923084TamargoCUNY City CollegeTECHNICAL SUMMARY: This proposal aims to establish a comprehensive X-ray diffraction analysis facility at The City College of New York (CCNY) that enables a wide range of materials research programs and educational programs in areas spanning molecular beam epitaxy, nanotechnology, materials synthesis, crystal growth and environmental science. CCNY has identified Materials Research as a strategic area of growth. This instrument will be essential to accomplish that goal. We propose to acquire a High Resolution X-ray diffraction apparatus for Materials Research that is especially suitable for thin film applications such as rocking curve analysis, reciprocal space mapping, reflectometry, thin film phase analysis, residual stress and texture analysis, and nanoparticle structure analysis. In addition to four-bounce high resolution optics, the system will incorporate micro-diffraction, glancing angle X-ray diffraction, X-ray reflectometry and a Nano-accessory kit. Important advances in nanoscience and nanotechnology, environmental science, energy systems and materials science are anticipated outcomes. There are eleven participating faculty from CCNY whose research will benefit immediately from this instrument acquisition. Participants from other CUNY Colleges and neighboring institutions, as well as industrial partners will also be users. CCNY is a minority institution with an exceedingly diverse student population at both the graduate and undergraduate levels. Having the proposed instrumentation in-house will expose our students to state-of-the-art techniques in materials science, will attract more students to research, and will increase the involvement of underrepresented minority students in these vital scientific areas. LAYMAN SUMMARY: X-ray diffraction is a fundamental analytical tool that allows the investigation of the atomic arrangement of materials, and many structural properties, such as the presence and nature of defects, or special atomic ordering in materials. Materials are used in many critical applications, including electronic and photonic semiconductor devices, solar cells, etc. The knowledge of the precise atomic arrangements of materials is essential in order to improve their properties, design new materials, and understand the fundamental physics that govern their behavior. At the City College of New York (CCNY), we have identified Materials Research as a top priority in which to focus our efforts, due to the potential impact of this discipline in our nation?s economic and technological development. A High Resolution X-ray diffraction apparatus is essential to perform the state-of-the-art research in materials that our faculty are trained to do. This instrument is multifaceted and versatile. In addition to offering the high resolution options needed for the investigation of highly ordered crystalline structures, it allows the incorporation of accessories that facilitate other studies carried out by our faculty. Important advances in nanoscience and nanotechnology, environmental science, energy systems and materials science are anticipated. CCNY has an exceedingly diverse student population, with large fractions of students from underrepresented minority groups. This instrument will expose a large number of students to state-of-the-art techniques in materials science, will attract more students to research, and will increase the involvement of underrepresented minority students in these vital scientific areas.

0923084 TamargoCUNY城市学院技术概要：本提案旨在纽约城市学院（CCNY）建立一个全面的X射线衍射分析设施，使广泛的材料研究计划和教育计划，在分子束外延，纳米技术，材料合成，晶体生长和环境科学领域。CCNY已将材料研究确定为战略增长领域。这一文书对实现这一目标至关重要。我们建议获得一个高分辨率的X射线衍射设备的材料研究，是特别适合于薄膜的应用，如摇摆曲线分析，倒易空间映射，反射，薄膜相分析，残余应力和纹理分析，和纳米颗粒结构分析。除了四个反弹高分辨率光学，该系统将纳入微衍射，掠射角X射线衍射，X射线反射计和纳米配件包。预计将在纳米科学和纳米技术、环境科学、能源系统和材料科学方面取得重要进展。CCNY有11名参与教师，他们的研究将立即从这次仪器收购中受益。来自其他城市大学学院和邻近机构的参与者，以及工业合作伙伴也将成为用户。CCNY是一个少数民族的机构，在研究生和本科生两个层次上都有非常多样化的学生群体。在内部拥有拟议的仪器将使我们的学生接触到材料科学中最先进的技术，将吸引更多的学生进行研究，并将增加代表性不足的少数民族学生在这些重要科学领域的参与。通俗总结：X射线衍射是一种基本的分析工具，可以研究材料的原子排列和许多结构特性，例如缺陷的存在和性质，或材料中的特殊原子有序性。材料用于许多关键应用，包括电子和光子半导体器件，太阳能电池等。材料的精确原子排列的知识对于改善其性能，设计新材料以及了解支配其行为的基本物理学至关重要。在纽约城市学院（CCNY），我们已经确定材料研究作为一个重中之重，其中集中我们的努力，由于这个学科在我们国家的潜在影响？的经济和技术发展。高分辨率X射线衍射仪是必不可少的，以执行国家的最先进的材料研究，我们的教师受过训练做。这一工具是多方面和多功能的。除了提供高度有序的晶体结构的调查所需的高分辨率选项外，它还允许纳入附件，以促进我们的教师进行的其他研究。预计纳米科学和纳米技术、环境科学、能源系统和材料科学将取得重要进展。CCNY有一个非常多样化的学生群体，学生的大部分来自代表性不足的少数群体。该仪器将使大量学生接触材料科学的最先进技术，将吸引更多的学生进行研究，并将增加代表性不足的少数民族学生在这些重要科学领域的参与。