Acquisition of a Modern X-ray Powder Diffractometer to Support Researchers and Educators

凭借化学研究仪器和设施：多用户（CRIF：MU）计划的这一奖项，来自印第安纳州大学的大卫·吉德罗克教授及其同事柳德米拉·布朗斯坦、丹尼尔·明迪奥拉、马伦·平克和萨拉·斯克拉巴拉克将获得一台配备变温系统的X射线粉末衍射仪。该奖项将加强各级的研究培训和教育，特别是在以下研究领域：（a）磁性纳米颗粒作为先进材料的基石，（B）通过粉末X射线衍射表征用于光催化应用的无机固体，（c）手性分散体分子的自组装：用于纳米纤维和有机凝胶结构分析的粉末XRD，（d）用变温X射线粉末衍射研究相变，（e）固态反应的原位研究，X射线衍射仪可以精确测量分子的完整三维结构，包括键距和角度，并提供有关单晶或晶体粉末样品中分子相对于相邻分子的空间排列的准确信息。粉末X射线衍射（XRD）图案也可用于阐明样品中结晶相的结构和相对丰度，其可暴露材料膜相对于结晶基底表面的优选结晶取向（称为织构）的存在，并且XRD线宽可提供平均微晶（或晶粒）直径的估计。此外，可以通过粉末XRD研究材料的极薄膜（100 nm）的结构，而这种膜不能通过单晶XRD探测。这里描述的研究将影响许多领域，包括有机和无机化学，以及材料化学。该工具将成为教学和研究的一个组成部分，也将通过网络使能提供给合作者和学生。

With this award from the Chemistry Research Instrumentation and Facilities: Multi-user (CRIF:MU) program, Professor David Giedroc and colleagues Lyudmila Bronstein, Daniel Mindiola, Maren Pink and Sara Skrabalak from Indiana University will acquire an X-ray powder diffractometer equipped with a variable temperature system. The award will enhance research training and education at all levels, especially in areas of study such as (a) magnetic nanoparticles as building blocks in advanced materials, (b) characterization of inorganic solids for photocatalytic applications by powder X-ray diffraction, (c) self-assembly of chiral discotic molecules: powder XRD for structure analysis of nanofibers and organogels, (d) study of phase transitions with variable temperature X-ray powder diffraction, (e) in-situ investigations of solid state reactions, An X-ray diffractometer allows accurate and precise measurements of the full three dimensional structure of a molecule, including bond distances and angles, and provides accurate information about the spatial arrangement of a molecule relative to neighboring molecules in single crystals or in crystalline powdered samples. Powder X-ray diffraction (XRD) patterns can also be used to elucidate the structure and relative abundance of the crystalline phases in a sample, it can expose the existence of preferred crystalline orientation (called texture) of a film of a material relative to a crystalline substrate surface, and the XRD linewidth can provide an estimate of the mean crystallite (or grain) diameter. In addition, the structure of extremely thin films (100 nm) of materials can be investigated by powder-XRD whereas such films cannot be probed by single-crystal XRD. The studies described here will impact a number of areas, including organic and inorganic chemistry, as well as materials chemistry. This instrument will be an integral part of teaching as well as research and will also be available to collaborators and students via cyber-enabling.