Acquisition of a high performance ambient atomic force microscope

通过化学研究仪器和设施：多用户（CRIF:MU）项目的奖励，来自加州大学默塞德分校的Anne Kelley教授及其同事Erik Menke和Tao Ye将获得一台原子力显微镜（AFM）。该奖项将加强各级的研究培训和教育，特别是在以下领域的研究：(a)与纳米颗粒混合的聚合物薄膜的结构和局部电导率，(b)通过半导体纳米颗粒聚集体的电荷传输，(c)用对映选择性自催化反应放大表面诱导手性，以及(d)电化学驱动的纳米级电机。原子力显微镜用于表征纳米级表面形貌，区分表面上不同的分子覆盖范围，展开聚合物，计算基底刚度，并量化相互作用力。AFM通常有一个悬臂，其末端有一个尖点，用于扫描试样表面。当尖端接近样品表面时，尖端和样品之间的力会导致悬臂的偏转。这种偏转通常是用从悬臂顶部表面反射到探测器的激光光斑来测量的。这一工具不仅将用于研究，而且还将用于学生的研究训练和外联活动。

With this award from the Chemistry Research Instrumentation and Facilities: Multi-user (CRIF:MU) program, Professor Anne Kelley and colleagues Erik Menke and Tao Ye from the University of California - Merced will acquire an atomic force microscope (AFM). The award will enhance research training and education at all levels, especially in areas of study such as (a) structure and local conductivity of polymer thin films blended with nanoparticles, (b) charge transport through semiconductor nanoparticle aggregates, (c) amplification of surface induced chirality with enantioselective autocatalytic reactions, and (d) electrochemically driven nanoscale motors.An atomic force microscope is used to characterize surface topography on a nanoscale level, distinguish different molecular coverage on surfaces, unfold polymers, calculate substrate stiffness, and quantify interaction forces. The AFM generally has a cantilever with a sharp point at its end used to scan the specimen surface. When the tip is brought into proximity of a sample surface, forces between the tip and the sample lead to a deflection of the cantilever. This deflection is often measured using a laser spot reflected from the top surface of the cantilever into a detector. This instrument will be used not only in research but also for research training of students and in outreach activities.