Acquisition of a high performance ambient atomic force microscope

凭借化学研究仪器和设施：多用户（CRIF：MU）计划的这一奖项，来自加州大学默塞德的Anne Kelley教授及其同事Erik Menke和Tao Ye将获得原子力显微镜（AFM）。该奖项将加强各级的研究培训和教育，特别是在研究领域，如（a）与纳米颗粒混合的聚合物薄膜的结构和局部导电性，（B）通过半导体纳米颗粒聚集体的电荷传输，（c）通过对映选择性自催化反应放大表面诱导手性，和（d）电化学驱动的纳米级马达。原子力显微镜用于表征纳米级水平上的表面形貌，区分表面上的不同分子覆盖度，展开聚合物，计算基底刚度，并量化相互作用力原子力显微镜通常有一个悬臂，其末端有一个尖锐的点，用于扫描样品表面。当尖端接近样品表面时，尖端和样品之间的力导致悬臂的偏转。这种偏转通常使用从悬臂的顶表面反射到检测器中的激光光斑来测量。这一工具不仅将用于研究，而且还将用于学生的研究培训和外联活动。

With this award from the Chemistry Research Instrumentation and Facilities: Multi-user (CRIF:MU) program, Professor Anne Kelley and colleagues Erik Menke and Tao Ye from the University of California - Merced will acquire an atomic force microscope (AFM). The award will enhance research training and education at all levels, especially in areas of study such as (a) structure and local conductivity of polymer thin films blended with nanoparticles, (b) charge transport through semiconductor nanoparticle aggregates, (c) amplification of surface induced chirality with enantioselective autocatalytic reactions, and (d) electrochemically driven nanoscale motors.An atomic force microscope is used to characterize surface topography on a nanoscale level, distinguish different molecular coverage on surfaces, unfold polymers, calculate substrate stiffness, and quantify interaction forces. The AFM generally has a cantilever with a sharp point at its end used to scan the specimen surface. When the tip is brought into proximity of a sample surface, forces between the tip and the sample lead to a deflection of the cantilever. This deflection is often measured using a laser spot reflected from the top surface of the cantilever into a detector. This instrument will be used not only in research but also for research training of students and in outreach activities.