SHF: Small: Collaborative Research: Unified Framework for Adaptive Analog and Digital Performance Characterization using Learned Information from the Circuit Under Test

SHF：小型：协作研究：使用从被测电路中学到的信息进行自适应模拟和数字性能表征的统一框架

• 批准号: 1116252
• 负责人: Sule Ozev
• 金额: $ 20万
• 依托单位: Arizona State University
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 2011
• 资助国家: 美国
• 起止时间: 2011-07-01 至 2016-06-30
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=1116252&HistoricalAwards=false
• 关键词: SHF; Small; Collaborative; Research; Unified

As semiconductor technology scales to make smaller circuits in order to reduce circuit fabrication costs, a by-product is that it is very hard to make circuit components that match specifications exactly. Displacement of a single atom can make the circuit behave differently. The diversity of devices being produced from the same process with the same design makes it un-economical to test them with a "one size fits all" test program. Because each component is unique, we also need a test strategy that is fine-tuned to the circuit being tested. The proposed work involves adjusting the test program to devices under test iteratively as we gather information about each device throughout the testing process. Keeping a leading edge in information technology is essential for the economical and social well being of the nation. Our most advanced technologies produce statistically diverse devices from the same design and manufacturing specification. Future technologies will produce even more diverse devices. Thorough testing of these increasingly complex devices is a key component in maintaining an edge in information technology. This project will explore new testing methodologies by developing methods to enable a shift from static to dynamic test procedures. In addition, this project will pilot a set of undergraduate design projects involving collaboration between Georgia Tech and Arizona State to mimic the prevalent need to collaborate over long distances in industry.

随着半导体技术为了降低电路制造成本而缩小电路尺寸，一个副产品是很难制造出与规格完全匹配的电路元件。 单个原子的位移可以使电路的行为不同。 采用相同工艺生产的具有相同设计的设备的多样性使得用“一刀切”的测试程序来测试它们是不经济的。 由于每个组件都是唯一的，因此我们还需要针对被测电路进行微调的测试策略。 拟议的工作涉及调整测试程序，以反复测试下的设备，因为我们收集有关每个设备的信息，在整个测试过程中。 保持信息技术的领先优势对国家的经济和社会福祉至关重要。 我们最先进的技术从相同的设计和制造规范中生产出统计上不同的设备。 未来的技术将产生更加多样化的设备。 对这些日益复杂的设备进行全面测试是保持信息技术优势的关键组成部分。 本项目将通过开发方法来探索新的测试方法，以实现从静态测试程序到动态测试程序的转变。 此外，该项目将试点一套本科设计项目，涉及格鲁吉亚理工学院和亚利桑那州立大学之间的合作，以模仿工业中长距离合作的普遍需求。