A novel method for evaluation of micro diffraction patterns by means of focal curves

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The aim is the creation of a novel technique for evaluation of micro diffraction images to improve useable accuracy of for example Kossel images and the stability of corresponding calculations. This shall be targeted by the development of a new mathematical method by means of focal curves. This method shall only utilize the inner geometry of a single image to calculate crystal parameters and orientations. Thus it will be possible to avoid the use of imprecise tools like mechanical measuring devices or multiple detector planes. The intrinsic properties of focal curves can be used to reach that goal. Their theory and applicability in numerical techniques has to be studied further - potentially under a projective point of view. With this knowledge a new complete and self-contained method for determination of stress and strain tensors will be created to form a program for easy utilization. The following testing will use a multitude of different Kossel patterns to verify improvements in stability and accuracy.Means of transferring the created method to different micro diffraction techniques like EBSD and XRT shall not be disregarded.