A novel method for evaluation of micro diffraction patterns by means of focal curves

一种通过焦点曲线评估微衍射图案的新方法

• 批准号: 274248041
• 负责人: Professor Dr.-Ing. Jürgen Bauch
• 金额: --
• 依托单位: Lehrstuhl für Funktionswerkstoffe (aufgelöst)
• 依托单位国家: 德国
• 项目类别: Research Grants
• 财政年份: 2015
• 资助国家: 德国
• 起止时间: 2014-12-31 至 2019-12-31
• 项目状态: 已结题
• 来源: https://gepris.dfg.de/gepris/projekt/274248041?language=en
• 关键词: novel; method; evaluation; micro; diffraction

The aim is the creation of a novel technique for evaluation of micro diffraction images to improve useable accuracy of for example Kossel images and the stability of corresponding calculations. This shall be targeted by the development of a new mathematical method by means of focal curves. This method shall only utilize the inner geometry of a single image to calculate crystal parameters and orientations. Thus it will be possible to avoid the use of imprecise tools like mechanical measuring devices or multiple detector planes. The intrinsic properties of focal curves can be used to reach that goal. Their theory and applicability in numerical techniques has to be studied further - potentially under a projective point of view. With this knowledge a new complete and self-contained method for determination of stress and strain tensors will be created to form a program for easy utilization. The following testing will use a multitude of different Kossel patterns to verify improvements in stability and accuracy.Means of transferring the created method to different micro diffraction techniques like EBSD and XRT shall not be disregarded.

其目的是创造一种用于评价微衍射图像的新技术，以改进例如可用的科塞尔图像的精度和相应计算的稳定性。以此为目标，开发一种新的利用焦距曲线的数学方法。这种方法只能利用单幅图像的内部几何形状来计算晶体参数和取向。因此，可以避免使用不精确的工具，如机械测量装置或多个探测器平面。焦距曲线的固有性质可以用来达到这一目标。它们的理论和在数值技术中的适用性必须进一步研究--可能是在投射的观点下。有了这些知识，将创建一种新的、完整的确定应力和应变张量的方法，以形成一个易于使用的程序。下面的测试将使用大量不同的Kossel图案来验证稳定性和精确度的改进。不应忽视将所创建的方法转移到不同的微观衍射技术，如EBSD和XRT。

项目成果

Advances in the X-ray Rotation-Tilt Technique

X射线旋转倾斜技术的进展

• DOI: 10.1107/s2053273316093906
• 发表时间: 2016
• 期刊: Acta Crystallographica Section A
• 作者: J. Bauch;S. Enghardt;M. Heckert
• 通讯作者: M. Heckert

New applications of the X-ray rotation tilt technique

X射线旋转倾斜技术的新应用

• DOI: 10.1107/s1600576718001632
• 发表时间: 2018
• 期刊: Journal of Applied Crystallography
• 影响因子: 6.1
• 作者: M. Heckert;S. Enghardt;J. Bauch
• 通讯作者: J. Bauch