A novel method for evaluation of micro diffraction patterns by means of focal curves

其目的是创建一种新的技术，用于评估微衍射图像，以提高例如Kossel图像的可用精度和相应计算的稳定性。这将通过利用聚焦曲线开发新的数学方法来实现。该方法应仅利用单个图像的内部几何结构来计算晶体参数和取向。因此，可以避免使用不精确的工具，如机械测量装置或多个检测器平面。聚焦曲线的固有特性可以用来实现这一目标。他们的理论和数值技术的适用性必须进一步研究-潜在的投影的观点。有了这些知识，就可以建立一个新的、完整的应力应变张量的确定方法，并形成一个便于使用的程序。以下测试将使用大量不同的Kossel图案来验证稳定性和准确性的改进。将创建的方法转移到不同的微衍射技术（如EBSD和XRT）的方法不应被忽视。

The aim is the creation of a novel technique for evaluation of micro diffraction images to improve useable accuracy of for example Kossel images and the stability of corresponding calculations. This shall be targeted by the development of a new mathematical method by means of focal curves. This method shall only utilize the inner geometry of a single image to calculate crystal parameters and orientations. Thus it will be possible to avoid the use of imprecise tools like mechanical measuring devices or multiple detector planes. The intrinsic properties of focal curves can be used to reach that goal. Their theory and applicability in numerical techniques has to be studied further - potentially under a projective point of view. With this knowledge a new complete and self-contained method for determination of stress and strain tensors will be created to form a program for easy utilization. The following testing will use a multitude of different Kossel patterns to verify improvements in stability and accuracy.Means of transferring the created method to different micro diffraction techniques like EBSD and XRT shall not be disregarded.