Apparatus for rapid analysis of wide-angle X-ray diffraction patterns at high temperatures
Apparatus for rapid analysis of wide-angle X-ray diffraction patterns at high temperatures
批准号:
59880007
负责人:
HASHIZUME Hiroo
金额:
$4.67万
依托单位国家:
日本
项目类别:
Grant-in-Aid for Developmental Scientific Research
财政年份:
1984
资助国家:
日本
项目状态:
已结题
起止时间:
1984 至 1985
中文摘要
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英文摘要
An apparatus has been developed which permits rapid recording of Xray diffraction patterns from inorganic powder crystals at high temperatures. The apparatus is built on a newly designed cylindrical position sensitive gas detector with an angular coverage of 120 degree of arc. The detector uses a thin metal blade in the anode and is operated in the selfquenching streamer mode. The anode radius is as large as 250mm to be compatible with most high-temperature specimen chambers. A delay line reads out the position signal from the strip cathodes to give an angular resolution of 0.05 degree of arc. The detector is mounted on a two-axis goniometer to detect a diffraction pattern from a stationary powder specimen. To suppress the broadening of reflection lines in the detected pattern, a slit system limits the angular divergence of X-rays incident on the planar specimen. The data, collected in a multi-channel analyzer memory, is read into a computer for analysis by a pattern fitting program. A test made with a standard corundom specimen demonstrates the speed and precision of the apparatus: a diffraction pattern substantially better in resolution has been obtained in a recording time of 1/80 as compared with a standard theta-two theta scanning method. The experimental pattern has been fitted well with the calculated one to give structural parameters in good agreement with the published data for this material. The usefulness of the apparatus in high-temperature works has been shown in an application, where the structure of the delta phase in bismuth oxide is refined at 784 degree Celsius.
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Development of new techniques for the analysis of magnetic structures using third-generation synchrotron X-ray sources
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批准号:10044071
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项目类别:Grant-in-Aid for Scientific Research (B).
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资助金额:$2.82万
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财政年份:1998
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负责人:HASHIZUME Hiroo
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依托单位:
Analysis of interface magnetic structures in magnetic thin films using resonant X-ray scattering techniques
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批准号:09305019
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项目类别:Grant-in-Aid for Scientific Research (A)
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资助金额:$13.82万
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财政年份:1997
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负责人:HASHIZUME Hiroo
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依托单位:
Studies of mesoscopic structures with synchrotron X-rays
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批准号:07044135
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项目类别:Grant-in-Aid for international Scientific Research
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资助金额:$2.82万
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财政年份:1995
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负责人:HASHIZUME Hiroo
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依托单位:
X-ray reflection study of layred structures in multilayrs for magnetic recording
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批准号:06452310
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项目类别:Grant-in-Aid for General Scientific Research (B)
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资助金额:$3.46万
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财政年份:1994
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负责人:HASHIZUME Hiroo
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依托单位:
DEVELOPMENT OF A HIGH-PRECISION ELECTRON DENSITY MEASUREMENT TECHNIQUE FOR MULTILAYER FILMS
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批准号:06555092
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项目类别:Grant-in-Aid for Scientific Research (B)
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资助金额:$4.16万
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财政年份:1994
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负责人:HASHIZUME Hiroo
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依托单位:
Analysis of epilayr structures by high-resolution X-ray methods
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批准号:04044066
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项目类别:Grant-in-Aid for international Scientific Research
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资助金额:$3.39万
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财政年份:1992
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负责人:HASHIZUME Hiroo
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依托单位:
X-RAY STRUCTURES OF HETEROEPITAXIAL GROWTHS
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批准号:03402052
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项目类别:Grant-in-Aid for General Scientific Research (A)
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资助金额:$9.92万
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财政年份:1991
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负责人:HASHIZUME Hiroo
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依托单位:
Structure of Lattice-Matched Fluoride Films
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批准号:60460231
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项目类别:Grant-in-Aid for General Scientific Research (B)
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资助金额:$3.97万
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财政年份:1985
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负责人:HASHIZUME Hiroo
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依托单位:
海外基金