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Development of new techniques for the analysis of magnetic structures using third-generation synchrotron X-ray sources

开发利用第三代同步加速器X射线源分析磁结构的新技术

基本信息

批准号：
10044071
负责人：
HASHIZUME Hiroo
金额：
$ 2.82万
依托单位：
Nara Institute of Science and Technology (1999)Tokyo Institute of Technology (1998)
依托单位国家：
日本
项目类别：
Grant-in-Aid for Scientific Research (B).
财政年份：
1998
资助国家：
日本
起止时间：
1998 至 1999
项目状态：
已结题

项目摘要

The highly intense, parallel and polarized X-rays obtained from a third-generation synchrotron source has been converted into circular polarized X-rays using a diamond phase plate, which is used to develop a new technique for the determination of the magnetic structures of metal multilayers. The X-ray energy is tuned close to the adsorption edge of magnetic atoms to enhance the magnetic scattering . The K and L adsorption edges of the 3d and 4f metals are nicely located on the source spectrum of synchrotron X-rays. The difference scattering intensity measured using right and left circular structure. The specular reflection enables the out-of-plane distribution of the local magnetizations to be determined and the diffuse scattering provides information on the interface structure. The method features (1)the separate determination of the magnetic structures due to distinct magnetic atom species, (2)the analysis of the in-plane twist angles of local magnetizations by collecting X-ray data using two scattering planes with distinct azimuthal orientations and (3)the high momentum and special resolution. The joint Japan-US researchers at the Advanced Photon Source and the Spring-8 resulted in the determination of the magnetization structures and the interface magnetic structures of a [Fe(3.5nm)/Gd(5.4nm)]ィイD215ィエD2 multilayer. the result was reported in the Gordon Research Conference and the 6th International Conference on Surface X-rya and Neutron Scattering.

从第三代同步加速器获得的高强度、平行和偏振的X射线，用金刚石位相板转换成圆偏振X射线，用来发展一种测定金属多层膜磁结构的新技术。将X射线能量调谐到磁性原子的吸收边附近，以增强磁散射。3d和4f金属的K和L吸收边很好地位于同步辐射X射线源谱上。采用左、右圆形结构测得的散射强度差。镜面反射使得能够确定局部磁化强度的离面分布，而漫反射提供了关于界面结构的信息。该方法的特点是：(1)由于不同的磁原子物种而分别确定磁结构；(2)通过利用两个方位角不同的散射面收集X射线数据来分析局部磁化的面内扭角；(3)高动量和特殊分辨率。日美在先进光子源和SPRING-8上的联合研究结果确定了[Fe(3.5 nm)/Gd(5.4 nm)]ィイD215ィエD2多层膜的磁化结构和界面磁结构。这一结果发表在戈登研究会议和第六届表面X-RYA和中子散射国际会议上。