Development of new techniques for the analysis of magnetic structures using third-generation synchrotron X-ray sources

从第三代同步加速器源中发现了高度密集、平行和极化的X射线，并已将其转换成使用钻石相位板的圆形极化的X射线，因此已用于开发一种新的技术来确定金属多层的磁性结构。X射线能量被调谐到接近于磁性原子的吸收边缘，以增强磁性散射。3D和4F金属的K和L吸收边缘被精确地定位在同步加速器X射线的源光谱上。使用左和右循环结构的差异分布强度测量方法。特定的反射使局部磁化的平面外分布能够被确定并提供接口结构上的差异散射信息。该方法的特点是：（1）对磁性结构对分离磁性原子种类的分离确定;（2）利用两个具有分离均匀方向的分散平面上的X射线数据收集对局部磁性角度的分析;（3）高动量和特殊分辨率。The joint Japan-US researchers at the Advanced Photon Source and the Spring-8 resulted in the determination of the magnetization structures of a [Fe（3.5 nm）/Gd（5.4 nm）]在戈登研究会议和第六届表面X射线和中子散射国际会议上报告了结果。

The highly intense, parallel and polarized X-rays obtained from a third-generation synchrotron source has been converted into circular polarized X-rays using a diamond phase plate, which is used to develop a new technique for the determination of the magnetic structures of metal multilayers. The X-ray energy is tuned close to the adsorption edge of magnetic atoms to enhance the magnetic scattering . The K and L adsorption edges of the 3d and 4f metals are nicely located on the source spectrum of synchrotron X-rays. The difference scattering intensity measured using right and left circular structure. The specular reflection enables the out-of-plane distribution of the local magnetizations to be determined and the diffuse scattering provides information on the interface structure. The method features (1)the separate determination of the magnetic structures due to distinct magnetic atom species, (2)the analysis of the in-plane twist angles of local magnetizations by collecting X-ray data using two scattering planes with distinct azimuthal orientations and (3)the high momentum and special resolution. The joint Japan-US researchers at the Advanced Photon Source and the Spring-8 resulted in the determination of the magnetization structures and the interface magnetic structures of a [Fe(3.5nm)/Gd(5.4nm)]ィイD215ィエD2 multilayer. the result was reported in the Gordon Research Conference and the 6th International Conference on Surface X-rya and Neutron Scattering.