Development of new techniques for the analysis of magnetic structures using third-generation synchrotron X-ray sources

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The highly intense, parallel and polarized X-rays obtained from a third-generation synchrotron source has been converted into circular polarized X-rays using a diamond phase plate, which is used to develop a new technique for the determination of the magnetic structures of metal multilayers. The X-ray energy is tuned close to the adsorption edge of magnetic atoms to enhance the magnetic scattering . The K and L adsorption edges of the 3d and 4f metals are nicely located on the source spectrum of synchrotron X-rays. The difference scattering intensity measured using right and left circular structure. The specular reflection enables the out-of-plane distribution of the local magnetizations to be determined and the diffuse scattering provides information on the interface structure. The method features (1)the separate determination of the magnetic structures due to distinct magnetic atom species, (2)the analysis of the in-plane twist angles of local magnetizations by collecting X-ray data using two scattering planes with distinct azimuthal orientations and (3)the high momentum and special resolution. The joint Japan-US researchers at the Advanced Photon Source and the Spring-8 resulted in the determination of the magnetization structures and the interface magnetic structures of a [Fe(3.5nm)/Gd(5.4nm)]ィイD215ィエD2 multilayer. the result was reported in the Gordon Research Conference and the 6th International Conference on Surface X-rya and Neutron Scattering.