Study of localized defects in phase change materials and oxides with atom probe tomography and correlative microscopy (C08*)

C8项目将通过原子探针断层扫描与透射电子显微镜和电子束感应电流相结合的方法，在纳米尺度上探索各种价变和相变材料的结构、电学和化学性质。我们将在亚纳米水平上检测三维化学不均匀性，并分析缺陷的作用。对于SFB中探索的不同材料和器件概念，包括mott型氧化物和界面相变材料中的超晶格层，该项目将提供对化学和结构变化在转换过程及其动力学中的作用的见解。

Project C8 will explore the structural, electrical, and chemical properties of various valence-change and phase-change materials at the nanoscale by means of the combination of atom probe tomography with transmission electron microscopy and electron-beam induced current. We will detect chemical inhomo-geneities in three dimensions at the sub-nanometer level and will analyze the role of defects. For the different material and device concepts explored within the SFB, including Mott-type oxides and superlat-tice layers in interfacial phase-change materials, the project will provide insights into the role of chemistry and structural changes for the switching processes and its kinetics.