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atomic and molecular manipulation and fabrication of nano-strucure using atomic force microscopy

atomic and molecular manipulation and fabrication of nano-strucure using atomic force microscopy
使用原子力显微镜进行原子和分子操纵以及纳米结构的制造
批准号:
15201020
负责人:
SUGAWARA Yasuhiro
金额:
$25.96万
依托单位:
依托单位国家:
日本
项目类别:
Grant-in-Aid for Scientific Research (A)
财政年份:
2003
资助国家:
日本
项目状态:
已结题
起止时间:
2003 至 2005

项目摘要

项目成果

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中文摘要
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英文摘要
The objective of the present research is to develop the atomic and molecular manipulation method using atomic force microscopy. There are mainly two problems in this research ; (1)High sensitive force detection, (2)Investigation of the mechanism and condition on atomic and molecular manipulation using the atomic force acting between tip and surface.The main results of this research are as follows :(1)Mechanism and condition of vertical atomic manipulationWe clarified the mechanism and condition of vertical atomic and molecular manipulation to mechanically remove and deposit the atom and molecule on the surface. Here, we used the Si(111) surface as a sample surface. The measurement parameters were vibration amplitude of the oscillating cantilever, frequency shift and temperature of the sample.(2)Controllable factors of vertical atomic manipulation using modified tipThe electronic state of the tip apex was easily changed by modifying the tip apex. By using the modified tip, we further investigated the mechanism of vertical atomic manipulation to mechanically remove and deposit the atom on the surface.(3)Mechanism and condition of lateral atomic manipulationWe further investigated the mechanism and condition of lateral atomic manipulation to mechanically slide the atom on the surface. Here, we used the ionic crystal CaF_2 surface with small surface energy.
期刊论文(68)
专著(0)
科研奖励(0)
会议论文
走査型プローブ顕微鏡 未来予測
扫描探针显微镜的未来预测
DOI: --
发表时间: 2005
期刊:
影响因子: --
作者: [S-M Cho, R Kurihara, CA Strussmann, M Uozumi, H Yamakawa, T Yamasaki, K Soyano, H Shiraishi, M Morita, S Hashimoto., 菅原康弘(分担)]
通讯作者: 菅原康弘(分担)
N.Oyabu et al.: "Mechanical Vertical Manipulation of Selected Single Atoms by Soft Nanoindentation Using Near Contact Atomic Force Microscopy"Phys.Rev.Lett.. 90・17. 176102-1-176102-4 (2003)
N.Oyabu 等人:“使用近接触原子力显微镜通过软纳米压痕机械垂直操纵选定的单个原子”Phys.Rev.Lett.. 176102-1-176102-4 (2003)
DOI: --
发表时间:
期刊:
影响因子: --
作者: []
通讯作者:
S.Morita, Y.Sugawara: "Noncontact Atomic Force Microscopy on Semiconductor Surfaces"Surface and Interface Analysis. (In press). (2004)
S.Morita、Y.Sukawara:“半导体表面上的非接触原子力显微镜”表面和界面分析。
DOI: --
发表时间:
期刊:
影响因子: --
作者: []
通讯作者:
The origin of p(2x1) phase on Si(001) by NC-AFM at 5k
NC-AFM 在 5k 下观察 Si(001) 上 p(2x1) 相的起源
DOI: --
发表时间: 2006
期刊: Phys.Rev.Lett. 96
影响因子: --
作者: [S.J.Li, M.Niinomi, T.Akahori, T.Kasuga, R.Yang, Y.L.Hao, Y.J.Li et al.]
通讯作者: Y.J.Li et al.
26
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