Study on True Atomic Resolution Imaging Using Noncontact Atomic Force Microscopy

非接触式原子力显微镜真原子分辨率成像研究

基本信息

项目摘要

1) With an atomic force microscope (AFM) operating in the noncontact mode in an ultrahigh vacuum (UHV), the InP (110) 1x1 and GaAs (110) surfaces were observed. Rectangle lattice including the atomic-scale point defects have been clearly and reproducibly resolved. These results clearly show that the noncontact UHV AFM has true atomic-scale lateral resolution and is quite effective for atomic surface structure analysis in real space.2) The constant vibration mode and the constant excitation mode in noncontact atomic force microscopy were compared to investigate the force interaction between tip and surface. When the tip touch the surface, the repulsive force interaction is weakened in the constant excitation mode because of the decrease of the vibration amplitude of the cantilever, while it is maintained in the constant amplitude mode. This means that the constant excitation mode is much more gentle than the constant vibration mode.3) With an atomic force microscope (AFM) operating in the noncontact mode in an ultrahigh vacuum (UHV), the reactive Si (111) 7*7 surface was observed. The individual adatoms and the corner holes in the 7*7 reconstruction, described by the dimer-adatom-stacking fault (DAS) model and also missing adatoms, can be observed.4) We found the discontinuity of the force gradient curve on reactive Si (111) 7*7 reconstructed surface. A strong contrast has been obtained with discontinuity, while weak contrast has been obtained without discontinuity. Thus, the image contrast is drastically increased by the presence of the discontinuity of the force gradient curve. The discontinuity of the force gradient curve can be explained by the crossover between the physical and chemical bonding interaction.
1)利用原子力显微镜(AFM)在超高真空(UHV)中以非接触方式工作,观察了InP(110)1 × 1和GaAs(110)表面。包括原子尺度点缺陷的矩形晶格已被清楚地和可重复地解决。这些结果表明,非接触式超高真空原子力显微镜具有真正的原子尺度横向分辨能力,是真实的空间中原子表面结构分析的有效手段。2)比较了非接触式原子力显微镜中的恒定振动模式和恒定激励模式,研究了针尖与表面之间的力相互作用。当针尖接触表面时,由于悬臂梁振动幅度的减小,在等幅激励模式下排斥力相互作用减弱,而在等幅激励模式下排斥力相互作用保持不变。3)利用原子力显微镜(AFM)在超高真空(UHV)中以非接触方式工作,观察了Si(111)7*7表面的反应性。在7*7重构表面上发现了单个吸附原子和角孔,这些吸附原子可以用DAS模型描述,也可以用缺失的吸附原子来描述。4)发现了反应性Si(111)7*7重构表面上力梯度曲线的不连续性。在不连续的情况下获得强对比度,而在不连续的情况下获得弱对比度。因此,由于力梯度曲线的不连续性的存在,图像对比度急剧增加。力梯度曲线的不连续性可以用物理键和化学键相互作用之间的交叉来解释。

项目成果

期刊论文数量(26)
专著数量(0)
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专利数量(0)
S.Morita et al.: "Contact and nonocontact mode imaging by atomic force microscopy" Thin Solid Film. 273. 138-142 (1996)
S.Morita 等人:“通过原子力显微镜进行接触和非接触模式成像”固体薄膜。
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Y.Sugawara: "Atomic-Resolution Imaging of ZnSSe(110)Surface with Ultrahigh-Vacuum Atomic Force Microscope(UHV-AFM)" Jpn. J. Appl. Phys.34. L462-L464 (1995)
Y.Sukawara:“利用超高真空原子力显微镜 (UHV-AFM) 对 ZnSSe(110) 表面进行原子分辨率成像” Jpn。
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H. Ueyama: "Atomically Resolved InP(110)Surface Observed with Noncontact Ultrahigh Vacuum Atomic Force Microscope" Jpn. J. Appl. Phys.34. L1086-L1088 (1995)
H. Ueyama:“用非接触式超高真空原子力显微镜观察原子分辨的 InP(110) 表面”Jpn。
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Y. Sugawara: "Defect Motion on an InP(110)Surface Observed with Noncontact Atomic Force Microscopy" Science. 270. 1646-1648 (1995)
Y. Sukawara:“用非接触原子力显微镜观察 InP(110) 表面上的缺陷运动”科学。
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S. Morita: "Contact and noncontact mode imaging by atomic force microscopy" Thin Solid Film. 273. 138-142 (199)
S. Morita:“通过原子力显微镜进行接触和非接触模式成像”固体薄膜。
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SUGAWARA Yasuhiro其他文献

SUGAWARA Yasuhiro的其他文献

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{{ truncateString('SUGAWARA Yasuhiro', 18)}}的其他基金

Assembly of nanostructure on insulating surfaces and investigation of gas reaction mechanism using atomic force microscopy
绝缘表面纳米结构的组装以及使用原子力显微镜研究气体反应机理
  • 批准号:
    16H06327
  • 财政年份:
    2016
  • 资助金额:
    $ 5.12万
  • 项目类别:
    Grant-in-Aid for Scientific Research (S)
Development of Liquid High-Speed Atomic Force Microscopy With atomic resolution
具有原子分辨率的液体高速原子力显微镜的发展
  • 批准号:
    22656014
  • 财政年份:
    2010
  • 资助金额:
    $ 5.12万
  • 项目类别:
    Grant-in-Aid for Challenging Exploratory Research
Investigation of Mechanical Manipulation of Atoms and Molecules on Insulator Surfaces with Extreme Field Atomic Force Microscopy
用极场原子力显微镜研究绝缘体表面原子和分子的机械操纵
  • 批准号:
    20221004
  • 财政年份:
    2008
  • 资助金额:
    $ 5.12万
  • 项目类别:
    Grant-in-Aid for Scientific Research (S)
atomic and molecular manipulation and fabrication of nano-strucure using atomic force microscopy
使用原子力显微镜进行原子和分子操纵以及纳米结构的制造
  • 批准号:
    15201020
  • 财政年份:
    2003
  • 资助金额:
    $ 5.12万
  • 项目类别:
    Grant-in-Aid for Scientific Research (A)
Measurement Condition on True Atomic Resolution Imaging of Noncontact Atomic Force Microscope
非接触式原子力显微镜真实原子分辨率成像的测量条件
  • 批准号:
    11450018
  • 财政年份:
    1999
  • 资助金额:
    $ 5.12万
  • 项目类别:
    Grant-in-Aid for Scientific Research (B).
Development of Electrostatic Force Microscope with Spatial Resolution For Elementary Charge
基本电荷空间分辨率静电力显微镜的研制
  • 批准号:
    11554013
  • 财政年份:
    1999
  • 资助金额:
    $ 5.12万
  • 项目类别:
    Grant-in-Aid for Scientific Research (B).
Measurement Condition for Atomic Resolution imaging on Reactive Surfaces Using Atomic Force Microscopy
使用原子力显微镜在反应表面上进行原子分辨率成像的测量条件
  • 批准号:
    09450018
  • 财政年份:
    1997
  • 资助金额:
    $ 5.12万
  • 项目类别:
    Grant-in-Aid for Scientific Research (B)
Development of Photon Atomic Force Microscope
光子原子力显微镜的研制
  • 批准号:
    08554007
  • 财政年份:
    1996
  • 资助金额:
    $ 5.12万
  • 项目类别:
    Grant-in-Aid for Scientific Research (B)

相似海外基金

Measurement Condition on True Atomic Resolution Imaging of Noncontact Atomic Force Microscope
非接触式原子力显微镜真实原子分辨率成像的测量条件
  • 批准号:
    11450018
  • 财政年份:
    1999
  • 资助金额:
    $ 5.12万
  • 项目类别:
    Grant-in-Aid for Scientific Research (B).
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