Development of Liquid High-Speed Atomic Force Microscopy With atomic resolution
Development of Liquid High-Speed Atomic Force Microscopy With atomic resolution
批准号:
22656014
负责人:
SUGAWARA Yasuhiro
金额:
$2.21万
依托单位:
依托单位国家:
日本
项目类别:
Grant-in-Aid for Challenging Exploratory Research
财政年份:
2010
资助国家:
日本
项目状态:
已结题
起止时间:
2010 至 2011
中文摘要
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英文摘要
The objective of this research is to develop the high-speed atomic force microscopy with the capability to observe individual atoms on the surface in liquid and those dynamic phenomena. So we improved the all components(cantilever, scanner, deflection sensor, phase detector, and control circuit) of the high-speed atomic force microscopy. We also theoretically and experimentally clarified the measurement conditions to achieve the high spatial and time resolutions.
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DOI:
--
发表时间:
2011
期刊:
影响因子:
--
作者:
[菅原康弘, 李艶君, 内藤賀公]
通讯作者:
内藤賀公
Sub-nm Resolution Imaging on Sapphire Surface with Photon AFM
使用光子 AFM 在蓝宝石表面进行亚纳米分辨率成像
DOI:
--
发表时间:
2011
期刊:
影响因子:
--
作者:
[M.Furukawa, Y.Naitoh, Y.J.Li, Y.Sugawara]
通讯作者:
Y.Sugawara
Small-amplitude FM-AFM using a Si cantilever with very high stiffness and very high resonance frequency
使用具有极高刚度和极高谐振频率的 Si 悬臂的小振幅 FM-AFM
DOI:
--
发表时间:
2011
期刊:
影响因子:
--
作者:
[M. Haze, Y. Naitoh, Y. J. Li and Y. Sugawara]
通讯作者:
Y. J. Li and Y. Sugawara
Stable Contrast Mode on TiO_2 (110) Surface by AFM with W-coated Tips
具有 W 涂层尖端的 AFM 在 TiO_2 (110) 表面上的稳定对比度模式
DOI:
--
发表时间:
2011
期刊:
影响因子:
--
作者:
[Y.J.Li, Y.Tsukuda, Y.Naitoh, Y.Sugawara]
通讯作者:
Y.Sugawara
Effect of Surface Stress around the SA Step of Si(001) on the Dimer Structure Determined by Noncontact Atomic Force Microscopy at 5K
5K 下非接触原子力显微镜测定 Si(001) SA 台阶周围表面应力对二聚体结构的影响
DOI:
--
发表时间:
2010
期刊:
J.Phys.Soc.Jpn.
影响因子:
--
作者:
[Y.Naitoh, Y.J.Li, H.Nomura, M.Kageshima, Y.Sugawara]
通讯作者:
Y.Sugawara
共 38 条
Assembly of nanostructure on insulating surfaces and investigation of gas reaction mechanism using atomic force microscopy
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批准号:16H06327
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项目类别:Grant-in-Aid for Scientific Research (S)
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资助金额:$115.73万
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财政年份:2016
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负责人:SUGAWARA Yasuhiro
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依托单位:
Investigation of Mechanical Manipulation of Atoms and Molecules on Insulator Surfaces with Extreme Field Atomic Force Microscopy
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批准号:20221004
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项目类别:Grant-in-Aid for Scientific Research (S)
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资助金额:$58.99万
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财政年份:2008
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负责人:SUGAWARA Yasuhiro
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依托单位:
atomic and molecular manipulation and fabrication of nano-strucure using atomic force microscopy
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批准号:15201020
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项目类别:Grant-in-Aid for Scientific Research (A)
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资助金额:$25.96万
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财政年份:2003
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负责人:SUGAWARA Yasuhiro
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依托单位:
Measurement Condition on True Atomic Resolution Imaging of Noncontact Atomic Force Microscope
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批准号:11450018
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项目类别:Grant-in-Aid for Scientific Research (B).
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资助金额:$8.64万
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财政年份:1999
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负责人:SUGAWARA Yasuhiro
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依托单位:
Development of Electrostatic Force Microscope with Spatial Resolution For Elementary Charge
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批准号:11554013
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项目类别:Grant-in-Aid for Scientific Research (B).
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资助金额:$8.06万
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财政年份:1999
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负责人:SUGAWARA Yasuhiro
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依托单位:
Measurement Condition for Atomic Resolution imaging on Reactive Surfaces Using Atomic Force Microscopy
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批准号:09450018
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项目类别:Grant-in-Aid for Scientific Research (B)
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资助金额:$6.4万
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财政年份:1997
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负责人:SUGAWARA Yasuhiro
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依托单位:
Development of Photon Atomic Force Microscope
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批准号:08554007
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项目类别:Grant-in-Aid for Scientific Research (B)
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资助金额:$4.35万
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财政年份:1996
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负责人:SUGAWARA Yasuhiro
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依托单位:
Study on True Atomic Resolution Imaging Using Noncontact Atomic Force Microscopy
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批准号:07454067
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项目类别:Grant-in-Aid for Scientific Research (B)
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资助金额:$5.12万
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财政年份:1995
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负责人:SUGAWARA Yasuhiro
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依托单位: