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Development of Photon Atomic Force Microscope

光子原子力显微镜的研制

基本信息

批准号：
08554007
负责人：
SUGAWARA Yasuhiro
金额：
$ 4.35万
依托单位：
Osaka University
依托单位国家：
日本
项目类别：
Grant-in-Aid for Scientific Research (B)
财政年份：
1996
资助国家：
日本
起止时间：
1996 至 1997
项目状态：
已结题

来源：
https://kaken.nii.ac.jp/grant/KAKENHI-PROJECT-08554007/
关键词：
photon atomic force microscope near-field optics evanescent field force electron-hole pair creation electrostatic force ultrahigh vacuum 光学顕微鏡ニアフィールド回折限界全反射

项目摘要

1) By using the noncontact mode atomic force microscope with frequency modulation (FM) detection method in a high vacuum, the force gradient induced by the evanescent field was detected. There are two advantages of this method. One is high sensitivity as a force sensor. The other is that the local force gradient can be estimated without influence of capillary force due to water film on the prism surface. Using this method, we measured the force gradient distance curve induced by the evanescent field. We measured the incident beam intensity and bias voltage dependence of the force gradient induced by the evanescent field. As a result, we confirmed the surface photo-voltage (SPV) model. Furthermore, using the SPV model, we explained the results of the distance and polarization dependence of the force gradient.2) We demonstrated a novel method to detect the van der Waals force gradient and the force gardient induced by the optical evanescent field on the surface simultaneously with high resolution, using the noncontact mode atomic force microscopy with frequency modulation detection method. The force gradient due to the evanescent field could be enhanced by applying the bias voltage. Polystirene latex spheres with 100 nm diameter were observed with spatial resolution better than 50 nm (lambda/14). Minimum detectable frequency shift of the cantilever was 0.09 Hz, by which the minimum detectable values of the force gradient and force due to the evanescent field were estimated to be under 3.8x10^<-5> N/m and 0.66 pN,respectively.

1)在高真空条件下，利用调频非接触式原子力显微镜（FM）检测方法，对倏逝场诱导的力梯度进行了检测。这种方法有两个优点。一个是作为力传感器的高灵敏度。另一种方法是在不考虑棱镜表面水膜毛细力影响的情况下，估算局部力梯度。利用这种方法，我们测量了由倏逝场引起的力梯度距离曲线。我们测量了入射光束强度和偏置电压的依赖性的力梯度引起的倏逝场。结果证实了表面光电压（SPV）模型。利用SPV模型解释了力梯度与距离和偏振态的关系。2）提出了一种利用非接触原子力显微镜频率调制检测方法同时高分辨率地检测表面上的货车德瓦尔斯力梯度和光学倏逝场诱导的力梯度的新方法。通过施加偏置电压可以增强由倏逝场引起的力梯度。观察到直径为100 nm的聚苯乙烯乳胶球的空间分辨率优于50 nm（λ/14）。悬臂梁的最小可检测频移为0.09 Hz，由此估计力梯度和由倏逝场引起的力的最小可检测值分别在3.8 × 10 ^<-5>N/m和0.66 pN以下。