Investigation of Mechanical Manipulation of Atoms and Molecules on Insulator Surfaces with Extreme Field Atomic Force Microscopy
Investigation of Mechanical Manipulation of Atoms and Molecules on Insulator Surfaces with Extreme Field Atomic Force Microscopy
批准号:
20221004
负责人:
SUGAWARA Yasuhiro
金额:
$58.99万
依托单位:
依托单位国家:
日本
项目类别:
Grant-in-Aid for Scientific Research (S)
财政年份:
2008
资助国家:
日本
项目状态:
已结题
起止时间:
2008 至 2012
中文摘要
点击翻译按钮获取中文摘要
英文摘要
Stable and reproducible mechanical manipulation of atoms and molecules on insulator surfaces has not been realized. In the present study, by using extreme field noncontact atomic force microscopy, we investigated the control conditions and the mechanism for performing the mechanism manipulation ofatoms on insulator surfaces. We also investigated the novel physical properties of nanostructures fabricated by the atom manipulation.
期刊论文(0)
专著(0)
科研奖励(0)
会议论文
登录
查看更多内容
DOI:
10.1143/jjap.47.6121
发表时间:
2008-07
期刊:
Japanese Journal of Applied Physics
影响因子:
1.5
作者:
[Y. Li;N. Kobayashi;H. Nomura;Y. Naitoh;M. Kageshima;Y. Sugawara]
通讯作者:
Y. Li;N. Kobayashi;H. Nomura;Y. Naitoh;M. Kageshima;Y. Sugawara
Atomic Manipulation and Three-dimensional Force Spectroscopy on Cu(110)-O Surface with LT NC-AFM
Cu(110)-O 表面原子操纵和三维力谱 LT NC-AFM
DOI:
--
发表时间:
2012
期刊:
影响因子:
--
作者:
[Y. Sugawara, Y. Kinoshita, Y. Naitoh, and Y. J. Li]
通讯作者:
and Y. J. Li
Atomic-Scale Imaging of B/Si(111) √3 x√3 Surface by Noncontact Atomic Force Microscopy
通过非接触原子力显微镜对 B/Si(111) √3 x√3 表面进行原子尺度成像
DOI:
10.1143/jjap.47.8218
发表时间:
2008
期刊:
Jpn. J. Appl. Phys
影响因子:
--
作者:
[M. Kinoshita, Y. Naitoh, Y. J. Li, M. Kageshima and Y. Sugawara]
通讯作者:
M. Kageshima and Y. Sugawara
原子間力顕微鏡の高感度化・高速化・多機能化
提高原子力显微镜的灵敏度、速度和多功能性
DOI:
--
发表时间:
2009
期刊:
影响因子:
--
作者:
[Asada, K., Tomiwa, K., Okada, M., Itakura, S., 菅原康弘]
通讯作者:
菅原康弘
Influence of Si Cantilever Tip with/without tungsten coating on NC-AFM Imaging of Ge(001)Surface
带/不带钨涂层的Si悬臂尖端对Ge(001)表面NC-AFM成像的影响
DOI:
--
发表时间:
2009
期刊:
Nanotechnology (In press)
影响因子:
--
作者:
[Y. Naitoh, Y. Kinoshita, Y. J. Li, M. Kageshima, and Y. Sugawara]
通讯作者:
and Y. Sugawara
共 61 条
Assembly of nanostructure on insulating surfaces and investigation of gas reaction mechanism using atomic force microscopy
-
批准号:16H06327
-
项目类别:Grant-in-Aid for Scientific Research (S)
-
资助金额:$115.73万
-
财政年份:2016
-
负责人:SUGAWARA Yasuhiro
-
依托单位:
Development of Liquid High-Speed Atomic Force Microscopy With atomic resolution
-
批准号:22656014
-
项目类别:Grant-in-Aid for Challenging Exploratory Research
-
资助金额:$2.21万
-
财政年份:2010
-
负责人:SUGAWARA Yasuhiro
-
依托单位:
atomic and molecular manipulation and fabrication of nano-strucure using atomic force microscopy
-
批准号:15201020
-
项目类别:Grant-in-Aid for Scientific Research (A)
-
资助金额:$25.96万
-
财政年份:2003
-
负责人:SUGAWARA Yasuhiro
-
依托单位:
Measurement Condition on True Atomic Resolution Imaging of Noncontact Atomic Force Microscope
-
批准号:11450018
-
项目类别:Grant-in-Aid for Scientific Research (B).
-
资助金额:$8.64万
-
财政年份:1999
-
负责人:SUGAWARA Yasuhiro
-
依托单位:
Development of Electrostatic Force Microscope with Spatial Resolution For Elementary Charge
-
批准号:11554013
-
项目类别:Grant-in-Aid for Scientific Research (B).
-
资助金额:$8.06万
-
财政年份:1999
-
负责人:SUGAWARA Yasuhiro
-
依托单位:
Measurement Condition for Atomic Resolution imaging on Reactive Surfaces Using Atomic Force Microscopy
-
批准号:09450018
-
项目类别:Grant-in-Aid for Scientific Research (B)
-
资助金额:$6.4万
-
财政年份:1997
-
负责人:SUGAWARA Yasuhiro
-
依托单位:
Development of Photon Atomic Force Microscope
-
批准号:08554007
-
项目类别:Grant-in-Aid for Scientific Research (B)
-
资助金额:$4.35万
-
财政年份:1996
-
负责人:SUGAWARA Yasuhiro
-
依托单位:
Study on True Atomic Resolution Imaging Using Noncontact Atomic Force Microscopy
-
批准号:07454067
-
项目类别:Grant-in-Aid for Scientific Research (B)
-
资助金额:$5.12万
-
财政年份:1995
-
负责人:SUGAWARA Yasuhiro
-
依托单位:
海外基金