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Measurement Condition for Atomic Resolution imaging on Reactive Surfaces Using Atomic Force Microscopy

使用原子力显微镜在反应表面上进行原子分辨率成像的测量条件

基本信息

批准号：
09450018
负责人：
SUGAWARA Yasuhiro
金额：
$ 6.4万
依托单位：
Osaka University
依托单位国家：
日本
项目类别：
Grant-in-Aid for Scientific Research (B)
财政年份：
1997
资助国家：
日本
起止时间：
1997 至 1998
项目状态：
已结题

来源：
https://kaken.nii.ac.jp/grant/KAKENHI-PROJECT-09450018/
关键词：
atomic force microscope atomic force well-defined surface atomic resolution semiconductor surface attractive force dangling bond covalent bond

项目摘要

In this project, we investigated the force interactions between a Si tip and Si(111)<square root>3x<square root>3-Ag surface as well as between a Si tip and Ag (111) surface, using noncontact atomic force microscopy (AFM) operating in ultrahigh vacuum (UHV). AEM images on Si(111)<square root>3x<square root>3-Ag surface showed three types of contrasts which depended on the distance between a tip and a sample surface. At the tip-sample distance of about 0.1-0.3nm, AFM image showed the honeycomb arrangement. At the tip-sample distance of about 0-0.05nm, the images showed the periodic structure of the triangle consisting of three bright spots with relatively strong contrast. On the other hand, at the distance of 0.05-0.1nm, the image contrast seemed to be the synthesis of the above two types of contrasts. When the tip is far from the sample surface, the tip-sample interaction force is dominated by physical bonding interaction such as the Coulomb force and/or the van der Waals (vdW) force between the tip apex Si atom and Ag timer on the sample surface. On the other hand, just before the contact, the tip-sample interaction force is dominated by the chemical bonding interaction due to hybridization between the dangling bond out of the tip apex Si atom and the orbit of Si-Ag covalent bond on the surface. Furthermore, atomic resolution imaging of pure metallic surface of Ag (111) was achieved, suggesting that noncontact AFM has potential for investigation of pure metallic surface.

在本项目中，我们<square root><square root>使用非接触原子力显微镜（AFM）在超高真空（UHV）下研究了Si针尖与Si（111）3 × 3-Ag表面以及Si针尖与Ag（111）表面之间的力相互作用。在Si（111）<square root>3x <square root>3-Ag表面上的AEM图像显示了三种类型的对比度，这取决于针尖和样品表面之间的距离。在针尖-样品距离约0.1-0.3nm处，AFM图像显示蜂窝状排列。在针尖-样品距离为0-0.05nm处，图像呈现出由三个亮点组成的三角形周期结构，对比度较强。而在0.05-0.1nm的距离上，图像对比度似乎是上述两种对比度的综合。当针尖远离样品表面时，针尖与样品之间的作用力主要是针尖顶端Si原子与样品表面Ag原子之间的库仑力和/或货车范德华力（vdW）。另一方面，在接触之前，针尖-样品相互作用力由针尖顶端Si原子的悬挂键与表面上的Si-Ag共价键轨道之间的杂化引起的化学键相互作用主导。此外，对Ag（111）纯金属表面进行了原子分辨率成像，表明非接触式AFM在纯金属表面的研究中具有潜力。