Development of Prediction Method for Metal Line Failure Induced by High Current Density
Development of Prediction Method for Metal Line Failure Induced by High Current Density
批准号:
11555024
负责人:
SASAGAWA Kazuhiko
金额:
$3.71万
依托单位:
依托单位国家:
日本
项目类别:
Grant-in-Aid for Scientific Research (B).
财政年份:
1999
资助国家:
日本
项目状态:
已结题
起止时间:
1999 至 2000
中文摘要
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英文摘要
1. In order to simulate the failure process in polycrystalline line, slit-like elements were allocated in the mesh generation. The thickness of only the slit-like element was decreased based on the calculated value of the governing parameter for electromigration damage. Thus, a method of numerical simulation of the failure process was developed for the prediction of lifetime and failure site in polycrystalline lines.2. The lifetime and failure location of angled polycrystalline lines were predicted. The lines treated were different in film characteristics and line shape. On the other hand, experiment was performed with the same line shape, film characteristics and operating condition as those in the prediction. Good agreement between the predictions and the experimental results was obtained for the lifetime and the failure location. The usefulness of the prediction method for polycrystalline line failure was verified experimentally.3. By atomic force microscopic observation of failure process in bamboo lines, it was found that voids in bamboo lines appeared in the form like a shallow depression, not like a slit, and that the voids grew with shaving the surface of the void.4. A method of numerical simulation of the failure process in bamboo lines was developed. In the simulation, the metal line was divided into elements without introducing slit-like elements. By changing the thickness of each element, the failure process was simulated numerically using the governing parameter for electromigration damage in bamboo lines.5. Lifetime and failure site of angled bamboo lines were predicted. On the other hand, experiment was performed with the same line shape and under the same operating condition as those in the prediction. Good agreement between the predictions and the experimental results was obtained for the lifetime and the failure location. The usefulness of the prediction method for bamboo line failure was verified experimentally.
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笹川和彦(内藤一史,坂真澄,阿部博之): "エレクトロマイグレーション損傷支配パラメータを用いたバンブー配線の断線予測法"日本機械学会第12回計算力学講演会講演論文集. No.99-5. 305-306 (1999)
Kazuhiko Sasakawa(Kazushi Naito、Masumi Saka、Hiroyuki Abe):“使用电迁移损伤控制参数的竹布线断裂预测方法”第12届日本机械工程学会计算力学会议论文集第305-306号。 1999)
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K.Sasagawa(K.Naito,M.Hasegawa,M.Saka and H.Abe): "Prediction of Bamboo Line Failure by Using a Governing Parameter of Electromigration Damage"Proc.of Int.Workshop on Sensing and Evaluation of Materials System. 25-32 (2000)
K.笹川(K.Naito、M.Hasekawa、M.Saka 和 H.Abe):“利用电迁移损伤控制参数预测竹线故障”Proc.of Int.Workshop 材料系统传感与评估。
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K.Sasagawa (M.Hasegawa, M.Saka and H.Abe): "Verification of Governing Parameter for Electromigration Damage in Bamboo Lines"Proc.1999 JSME Annual Meeting. Vol.I, No.99-1. 21-22 (1999)
K.笹川(M.Hasekawa、M.Saka 和 H.Abe):“竹线电迁移损伤控制参数的验证”Proc.1999 JSME 年会。
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K.Sasagawa (K.Naito, H.Kimura, M.Saka and H.Abe): "Experimental Verification of Prediction Method for Polycrystalline Line Failure Using the Governing Parameter of Electromigration"Proc.1999 JSME Annual Meeting. Vol.I, No.99-1. 287-288 (1999)
K.Sasakawa(K.Naito、H.Kimura、M.Saka 和 H.Abe):“使用电迁移控制参数对多晶硅线路故障预测方法进行实验验证”Proc.1999 JSME 年会。
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K.Sasagawa (M.Hasegawa, M.Yagi, M.Saka and H.Abe): "Governing Parameter for Electromigration Damage in Polycrystalline Line Covered with Passivation Film"Proc 2000 JSME Annual Meeting. Vol.II, No.00-1. 25-26 (2000)
K.笹川 (M.Hasekawa、M.Yagi、M.Saka 和 H.Abe):“覆盖有钝化膜的多晶硅线路中电迁移损坏的控制参数”Proc 2000 JSME 年会。
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共 54 条
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