INVESTIGATION OF DAMAGE MECHANISM AND ESTIMATION OF STRENGTH OF CARBON NANOTUBES AS ELECTRONIC MATERIAL UNDER HIGH-DENSITY ELECTRONIC CURRENT

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Carbon nanotubes (CNTs) are expected to be applied to nano-sized electronic materials. A method of acceleration test to intentionally introduce damage to CNTs was developed by supplying high-density electronic current. Performing the test under various atmospheric and loading conditions the damage mechanism of CNT under electronic current was clarified. Furthermore, an evaluation method of strength of CNT was developed considering the damage mechanism. The evaluated results qualitatively agreed with experimental ones, and the strength of CNT under electronic current was successively evaluated.