Time-of-Flight secondary ion mass spectrometry

飞行时间二次离子质谱法

• 批准号: 458688785
• 金额: --
• 依托单位: Rheinisch-Westfälische Technische Hochschule Aachen
• 依托单位国家: 德国
• 项目类别: Major Research Instrumentation
• 财政年份: 2021
• 资助国家: 德国
• 起止时间: 2020-12-31 至 无数据
• 项目状态: 未结题
• 来源: https://gepris.dfg.de/gepris/projekt/458688785?language=en
• 关键词: Time; Flight; secondary; ion; mass

Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) is a surface analysis method that provides the structural composition of a wide variety of materials with high lateral and depth resolution. This method can be use to determine the local composition of the uppermost monolayers of a material such as a plastic, for example, and to perform a depth profile analysis. By using this method, many research questions from basic research become accessible, which could previously only be estimate on a theoretical basis. Examples are the spatially resolved analysis of plasma-based thin films, the representation of aging processes, migration issues of additives such as antioxidants as well as the characterisation of contaminations and the enrichment of stabilizers in recycled plastics. The ToF-SIMS offers the possibility to analyze depth profiles of near-surface areas by accompanying sputtering processes. This includes the chemical analysis of interfaces, which could not be achieved so far. The "Hybrid-SIMS" applied for as an extension also allows the identification and assignment of unknown substances, which is essential for the identification of contaminations. This is rapidly gaining importance, especially for the analysis of plastics from recycling processes.

飞行时间二次离子质谱法（ToF-SIMS）是一种表面分析方法，可提供具有高横向和深度分辨率的各种材料的结构组成。该方法可用于确定诸如塑料之类的材料的最上层单层的局部组成，并执行深度剖面分析。通过使用这种方法，许多基础研究中的研究问题变得触手可及，而这些问题以前只能在理论基础上进行估计。例如，等离子体薄膜的空间解析分析，老化过程的表征，添加剂（如抗氧化剂）的迁移问题，以及污染物的表征和再生塑料中稳定剂的富集。ToF-SIMS提供了通过伴随溅射过程分析近地表深度剖面的可能性。这包括对界面的化学分析，这是迄今为止无法实现的。作为扩展申请的“Hybrid-SIMS”还允许识别和分配未知物质，这对于识别污染至关重要。这一点正迅速变得越来越重要，尤其是对回收过程中塑料的分析。