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Development of a Method to Evaluate the Surface of Single Crystal Substrates for Super-High-Frequency SAW Devices by UMS Technology

Development of a Method to Evaluate the Surface of Single Crystal Substrates for Super-High-Frequency SAW Devices by UMS Technology
利用 UMS 技术开发评估超高频 SAW 器件单晶衬底表面的方法
批准号:
12450119
负责人:
KUSHIBIKI Jun-ichi
金额:
$9.6万
依托单位:
依托单位国家:
日本
项目类别:
Grant-in-Aid for Scientific Research (B)
财政年份:
2000
资助国家:
日本
项目状态:
已结题
起止时间:
2000 至 2002

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中文摘要
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英文摘要
In this study, ultrasonic microspectroscopy (UMS) technology, using the line-focus-beam (LFB) and plane-wave ultrasonic material characterization system, has been applied to the problems associated with the homogeneities and modified/damaged surface layers of LiNbO_3 and LiTaO_3 single crystals for super-high-frequency (SHF) surface acoustic wave (SAW) devices. The purpose of this study was to establish the quantitative analysis and evaluation method using this technology.1. The relative and absolute accuracies for the propagation characteristics of leaky SAW (LSAW) measured by the LFB-UMC system have been improved.2. Chemical composition dependences of the acoustical physical constants of LiNbO_3 and LiTaO_3 single crystals were determined. This enables us to calculate the propagation characteristics of LSAW and SAW for the crystals with an arbitrary chemical composition.3. Experimental relationships (calibration lines) among the LSAW velocity, Curie temperature, lattice constants, et … More c., were obtained to evaluate each property of the crystals by a common scale of LSAW velocity.4. A method for improving the crystal growth conditions through the evaluation of the chemical composition distributions of commercially available LiTaO_3 single crystals was proposed and an extremely homogeneous crystal was successfully grown.5. For the demonstration of evaluating modified/damaged surface layers, we fabricated several LiTaO_3 substrates with protonexchanged layers and domain-inverted layers as model specimens. The thickness resolution of the surface layers estimated by LSAW velocity was nanometer order.6. The resolution of scanning nonlinear dielectric microscopy was improved with an atomic size.7. Center frequencies and SAW velocities were measured for 0.5, 1, and 2 GHz-band SAW filters fabricated on LiTaO_3 wafers whose distributions in chemical composition were preexamined by measuring LSAW velocities. The results exhibited that variations of the center frequencies and differences between the calculated and measured SAW velocities became larger as the frequency became higher. It was considered that problems associated with the damaged surface layers of the substrates were detected. Less
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M.Miyashita, J.Kushibiki: "Quantitative Characterization of the Fabrication Processes of Domain-Inverted Layers in LiTaO_3 by the Line-Focus-Beam Ultrasonic Material Characterization System"J.Appl.Phys.. 92. 3958-3966 (2002)
M.Miyashita,J.Kushibiki:“通过线聚焦束超声材料表征系统对 LiTaO_3 中畴反转层的制造过程进行定量表征”J.Appl.Phys.. 92. 3958-3966 (2002)
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J.Kushibiki, Y.Ono, and Y.Ohashi: "Experimental Considerations on Water-Couplant Temperature for Accurate Velocity Measurements by the LFB Ultrasonic Material Characterization System"IEEE Ultrasonics Symp.Proc.. 619-623 (2000)
J.Kushibiki、Y.Ono 和 Y.Ohashi:“LFB 超声波材料表征系统精确测量速度的水耦合剂温度的实验考虑”IEEE Ultrasonics Symp.Proc.. 619-623 (2000)
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Y.Cho and K.Ohara: "Higher Order Nonlinear Dielectric Imaging Using Scanning Nonlinear Dielectric Mictoscopy"Jpn.J.Appl.Phys.. Vol.40, No.6B. 4349-4353 (2001)
Y.Cho 和 K.Ohara:“使用扫描非线性介电显微镜进行高阶非线性介电成像”Jpn.J.Appl.Phys.. Vol.40,No.6B。
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