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A New Environmental Chamber for Nano-meter Position Measurement and control on Ultra-precision Machine Tools with Interferometry

A New Environmental Chamber for Nano-meter Position Measurement and control on Ultra-precision Machine Tools with Interferometry
干涉测量超精密机床纳米位置测量与控制的新型环境室
批准号:
17560112
负责人:
YAMAGUCHI Katsumi
金额:
$1.02万
依托单位国家:
日本
项目类别:
Grant-in-Aid for Scientific Research (C)
财政年份:
2005
资助国家:
日本
项目状态:
已结题
起止时间:
2005 至 2006

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中文摘要
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英文摘要
Since laser interferometer systems are high accuracy, non-contact measurement and easy installation, the systems have been incorporated into such manufacturing equipment as precision cutting machines, measuring machines and lithographic systems. The unit of measure for a laser measurement system is dependent on the wavelength of the laser source. The wavelength in atmosphere is affected by the refractive index of surrounding air, which depends on the temperature, relative humidity and air pressure. Without proper environmental control, degradation in system accuracy and repeatability will occur and limit the quality of final products. We have designed and produced a new environmental chamber for precision machine tools with laser interferometer system. The chamber consists of a precise air conditioner, a negative/positive pressure controller and a closed workspace surrounded with the insulating panels. The air conditioner provides the controlled environment within temperature change of 0.2℃ P-V (peak-to-valley) and humidity change of 4% P-V. The negative/positive controller can maintain an even pressure within an accuracy of 0.4hPa P-V by adjusting inside pressure to either negative or positive relative to outside. To utilize the insulating panels for making the chamber frame allows for low cost and easy construction. The fluctuation in the relative tool displacement to the workpiece and the surface profile formed by raster flycutting are measured to verify the environmental control performance for a long period. A fluctuation of 109nm P-V in the displacement and a form accuracy of 91nm P-V are obtained ; both the results demonstrate the highly compensated accuracy due to the new environmental chamber.
期刊论文(18)
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会议论文
DOI: --
发表时间: 2005
期刊: Proceeding of Autumn Conference of Japan Society for Precision Engineering
影响因子: --
作者: [Kazutoshi ADACHI, Katsumi YAMAGUCHI, Sakuro HONDA, Kazuo Murata, Hideki IWAI, Nobutaka TAKAMI, Shoichi SHIMADA, Naoya IKAWA]
通讯作者: Naoya IKAWA
ナノ加工・計測計測のための環境一定制御チャンバーの開発
开发用于纳米制造和测量的恒定环境控制室
DOI: --
发表时间: 2007
期刊: 日本機械学会論文集C編 73-731
影响因子: --
作者: [Kazutoshi ADACHI, Katsumi YAMAGUCHI, Hideki IWAI, Sakuro HONDA, Yuzo OKAWA, Shoichi SHIMADA, 山口勝己(他5名 1番目)]
通讯作者: 山口勝己(他5名 1番目)
超精密加工機におけるレーザー測長誤差のための環境補正装置の開発
超精密加工机激光测长误差环境校正装置的研制
DOI: --
发表时间: 2007
期刊: 精密工学会誌 73-4
影响因子: --
作者: [足立和俊, 山口勝己(他4名 2番目)]
通讯作者: 山口勝己(他4名 2番目)
レーザ測長誤差低減のための環境補償技術-環境補正装置の開発と超精密加工機への適用-
减少激光测长误差的环境补偿技术 - 环境补偿装置的开发及其在超精密加工机上的应用 -
DOI: --
发表时间: 2006
期刊: 光アライアンス 17・12
影响因子: --
作者: [足立和俊, 山口勝己(他1名 2番目)]
通讯作者: 山口勝己(他1名 2番目)
18
    Planning of Facility Related to the Medium in University Campus
    • 批准号:
      12650631
    • 项目类别:
      Grant-in-Aid for Scientific Research (C)
    • 资助金额:
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    • 财政年份:
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    • 负责人:
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    • 批准号:
      10650620
    • 项目类别:
      Grant-in-Aid for Scientific Research (C)
    • 资助金额:
      $1.34万
    • 财政年份:
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    • 依托单位:
    Forming of 3D Structure by Metal Jet.
    • 批准号:
      09355006
    • 项目类别:
      Grant-in-Aid for Scientific Research (A)
    • 资助金额:
      $19.2万
    • 财政年份:
      1997
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    • 依托单位:
    海外基金