Microscopic Fluctuations and Transport Mechanism of Few Electron Systems
Microscopic Fluctuations and Transport Mechanism of Few Electron Systems
批准号:
18063004
负责人:
SANO Nobuyuki
金额:
$29.82万
依托单位:
依托单位国家:
日本
项目类别:
Grant-in-Aid for Scientific Research on Priority Areas
财政年份:
2006
资助国家:
日本
项目状态:
已结题
起止时间:
2006 至 2009
中文摘要
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英文摘要
The discreteness of doped impurities and electrons in nano-scale MOSFETs become important because of the decrease in number of particles in such devices. In order to study such phenomena associated with discreteness, we have successfully developed the 3-D Monte Carlo simulator which takes account of the full Coulomb interaction among charged particles. The physical mechanism of electrons transport and device characteristics under nano-scale device structures have been studied via the Monte Carlo simulations.
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ナノスケール半導体構造における準弾道電子輸送
纳米级半导体结构中的准弹道电子传输
DOI:
--
发表时间:
2007
期刊:
応用物理学会誌 10
影响因子:
--
作者:
[Y.Watabe, Y.Honda, N.Koshida, 佐野伸行]
通讯作者:
佐野伸行
Analysis of Photon-Induced Drain Current in Polycrystalline-Silicon Thin-Film Transistors
多晶硅薄膜晶体管中光子感应漏电流的分析
DOI:
10.1143/jjap.48.101201
发表时间:
2009
期刊:
Jpn. J. Appl. Phys
影响因子:
--
作者:
[小松辰実, 須田良幸, H. Ikeda and N. Sano]
通讯作者:
H. Ikeda and N. Sano
Three -dimensional Monte Carlo Simulation of Electron Transport in Si Including Full Coulomb Interaction
包括全库仑相互作用的 Si 中电子输运的三维蒙特卡罗模拟
DOI:
--
发表时间:
2008
期刊:
Appl. Phys. Exp 1
影响因子:
--
作者:
[T.Fukui, T.Uechi, and N.Sano]
通讯作者:
and N.Sano
Electron Transport Simulations Including Full Coulomb Interaction in Si
电子传输模拟,包括 Si 中的全库仑相互作用
DOI:
--
发表时间:
2007
期刊:
影响因子:
--
作者:
[T. Fukui, T. Uechi, N. Sano]
通讯作者:
N. Sano
Discrete Impurity and Mobility in Drift-Diffusion Simulations for Device Characteristics Variability
器件特性变异性漂移扩散模拟中的离散杂质和迁移率
DOI:
--
发表时间:
2009
期刊:
影响因子:
--
作者:
[T. Karasawa, K. Nakanishi, and N.Sano]
通讯作者:
and N.Sano
共 26 条
Coulomb Interaction in Atomic-Layer FET Devices and Realistic Prediction of Device Characteristics
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批准号:15H03983
-
项目类别:Grant-in-Aid for Scientific Research (B)
-
资助金额:$10.48万
-
财政年份:2015
-
负责人:SANO Nobuyuki
-
依托单位:
Effects of the Coulomb Interaction and Realistic Device Analyses in 3D Nanoscale Semiconductor Devices
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批准号:24360130
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项目类别:Grant-in-Aid for Scientific Research (B)
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资助金额:$11.73万
-
财政年份:2012
-
负责人:SANO Nobuyuki
-
依托单位:
Simulation Study of Long-Range Coulomb Interaction in Nano-Scale Devices
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批准号:21360160
-
项目类别:Grant-in-Aid for Scientific Research (B)
-
资助金额:$11.23万
-
财政年份:2009
-
负责人:SANO Nobuyuki
-
依托单位:
Study of High-Density Electron Transport by Three-Dimensional Particle-Based Simulations under Nano-Scale Devices
-
批准号:18360160
-
项目类别:Grant-in-Aid for Scientific Research (B)
-
资助金额:$9.99万
-
财政年份:2006
-
负责人:SANO Nobuyuki
-
依托单位:
Device Modeling of Discrete Impurities for the Analyses of Threshold Voltage Fluctuations in Ultrasmall Semiconductor Devices
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批准号:14550315
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项目类别:Grant-in-Aid for Scientific Research (C)
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资助金额:$2.05万
-
财政年份:2002
-
负责人:SANO Nobuyuki
-
依托单位:
Study on Device Lifetime Uncertainty asscociated with Substrate Current Fluctuation in Ultrasmall Semiconductor Devices
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批准号:10555115
-
项目类别:Grant-in-Aid for Scientific Research (B).
-
资助金额:$3.58万
-
财政年份:1998
-
负责人:SANO Nobuyuki
-
依托单位:
海外基金