Role of Localized Defects in 2D Materials: From Nanoscale Structure to Macroscale Properties

二维材料中局部缺陷的作用：从纳米级结构到宏观性能

• 批准号: 511602077
• 负责人: Professor Dr. Artur Philipp Nikolaus Erbe
• 金额: --
• 依托单位: Institut für Ionenstrahlphysik und Materialforschung
• 依托单位国家: 德国
• 项目类别: Research Grants
• 资助国家: 德国
• 项目状态: 未结题
• 来源: https://gepris.dfg.de/gepris/projekt/511602077?language=en
• 关键词: Role; Localized; Defects; 2D; Materials

Structural defects are an integral part of two-dimensional (2D) materials and they play one of the most decisive roles in their properties. Depending on the type, position, and concentration, defects influence almost every characteristic of the 2D material spanning from nano- to macroscale. Presently, there is a substantial gap between the basic characterization of the defects by means of ultra-high vacuum methods and the determination of the structure-property relationship through non-localized laboratory techniques, particularly for less studied 2D materials. We propose to bridge this gap through the synergetic collaboration of three teams with state-of-the-art expertise and facilities. The combination of controlled creation of defects and the nanoscale resolution of our local optoelectronic characterization techniques in the ambient environment, with the unique localized microscale spectroelectrochemical and largearea spectroscopic techniques and conductivity measurements, will facilitate unprecedented insight into this scale-bridging structure-property relationship.

结构缺陷是二维（2D）材料中不可或缺的一部分，对材料的性能起着决定性的作用。根据类型、位置和浓度，缺陷影响从纳米到宏观尺度的2D材料的几乎所有特性。目前，通过超高真空方法对缺陷进行基本表征与通过非局部实验室技术确定结构-性能关系之间存在很大差距，特别是对于研究较少的2D材料。我们建议通过三个拥有最先进的专业知识和设施的团队的协同合作来弥合这一差距。缺陷的控制创建和我们的本地光电表征技术在周围环境中的纳米级分辨率的组合，与独特的本地化的微尺度光谱电化学和largearea光谱技术和电导率测量，将促进前所未有的洞察到这种规模桥接结构-性能关系。