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Development of In Situ Nanoscopic Dynamic Damage Analyzer

原位纳米动态损伤分析仪的研制

基本信息

批准号：
09555030
负责人：
KOMAI Kenjiro
金额：
$ 8.7万
依托单位：
Kyoto University
依托单位国家：
日本
项目类别：
Grant-in-Aid for Scientific Research (B)
财政年份：
1997
资助国家：
日本
起止时间：
1997 至 1998
项目状态：
已结题

来源：
https://kaken.nii.ac.jp/grant/KAKENHI-PROJECT-09555030/
关键词：
Atomic Force Microscopy Micromechanical Testing In Situ Observation Environmental Strength under Dynamic Loading Environment induced Embittlement Microelemnt Single Fiber Tests High-Strength and High-Elastic-Modulus Fiber 動的環境強度環マイクロマシン

项目摘要

In situ nanoscopic damage analyzer has been developed based upon 1) an environmental atomic force microscope capable of imaging sample surface in a controlled environment such as vacuum, humid or dry gases and/or liquids, 2) micromechanical fatigue testing machine capable of applying a small varying load with sufficient precision. and 3) an environmental chamber. By using the developed system, in situ nanoscopic surface damage can be successfully evaluated under a dynamic loading in a controlled environment. The atomic force microscope used in the system has a piezo scanner, laser semiconductor and other electric circuits all situated upon the sample, and at the same time they are fully isolated from the environment or environment chamber. Therefore, atomic force microscope imaging of the sample surface in a controlled environment such as humid gases can be successfully performed without the laser semiconductor and piezo scanner being exposed to (humid) environment. For mechanical and fatigue tests, an electro-magnetic actuator is used, and thereby a small load can be precisely applied to a micromaterial such as microelements used in micromachine and high-strength and high-elastic modulus fibers. In this investigation, the single fiber tensile and fatigue tests were conducted in precursor type high-strength and high-elastic modulus ceramic fibers, and nanoscopic fiber surface damage was evaluated, and the usefulness of the developed system has been demonstrated.

原位纳米级损伤分析仪的开发基于：1）环境原子力显微镜，能够在受控环境（如真空、潮湿或干燥气体和/或液体）中对样品表面进行成像；2）微机械疲劳试验机，能够以足够的精度施加小的变化负载。 3) 环境室。通过使用开发的系统，可以在受控环境中的动态载荷下成功评估原位纳米级表面损伤。该系统中使用的原子力显微镜的压电扫描仪、激光半导体和其他电路均位于样品上，同时它们与环境或环境室完全隔离。因此，可以成功地在受控环境（例如潮湿气体）中对样品表面进行原子力显微镜成像，而无需将激光半导体和压电扫描仪暴露于（潮湿）环境。对于机械和疲劳测试，使用电磁致动器，从而可以将小负载精确地施加到微材料，例如微机械中使用的微元件以及高强度和高弹性模量纤维。在这项研究中，对前驱体型高强度和高弹性模量陶瓷纤维进行了单纤维拉伸和疲劳测试，并对纳米级纤维表面损伤进行了评估，并证明了所开发系统的实用性。