Establishment of the Negative-Ion Beam Technology for Material Modification
Establishment of the Negative-Ion Beam Technology for Material Modification
批准号:
05402027
负责人:
ISHIKAWA Junzo
金额:
$19.2万
依托单位:
依托单位国家:
日本
项目类别:
Grant-in-Aid for General Scientific Research (A)
财政年份:
1993
资助国家:
日本
项目状态:
已结题
起止时间:
1993 至 1995
中文摘要
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英文摘要
1.Development of High-Current Negative-Ion Source and Negative-Ion implanter :(1) We developed an intense RF plasma-sputter-type heavy negative-ion source (RFNIS) which can deliver high-current negative-ion beams in a dc-mode with an intensity of several mA of various elements required in the semiconductor fabrication, such as B,P,Si, and C.(2) Besides, we also developed a medium-current type negative-ion implanter equipped a small-type RFNIS.of which clean booth makes to implant ions in the clean condition as well as in the real implantation process.2.Investigation of Charging Phenomena of Substrates during Negative-Ion Implantation.(1) We found that the charging voltage of isolated electrodes at negative-ion implantation was only several volts positive. This charging mechanism with a low voltage was revealed to result from returning of emitted electrons with a low energy. (2) We developed a new method to measure the charging voltage of insulator surface by the analysis of secondary e … More lectron energy distribution and showed the charging potential of negative-ion implanted insulators was several volts negative. Besides, we proposed an electric double layr model as a low charging mechanism of insulators during negative-ion implantation.3.Evaluation of Negative-Ion Implanted DevicesFrom the evaluation of test devices of gate oxide after negative-ion implanted, the negative-ion implantation was found to be applicable in the future ULSI fabrication with low charging.4.Formation of This Film by a Low-Energy Negative-Ion Beam DepositionWe developed a negative-ion beam deposition system with a low energy in which a negative ion beam has a low energy spread of about 10eV.This system has a good energy controllability for the low energy beam of 30eV.Besides, the deposited a carbon film with a low carbon negative ions was found to be an amorphous diamond-like carbon film from XPS.5.Development of Non-Scattering Implantation Method into PowdersWe clarified the scattering phenomenon of powders during implantation by theoretically and experimentally with a positive ion implantation. On the contrary, even in the negative-ion implantation with an energy of 20keV,there was no scattering resulted. This shows the negative-ion implantation is non scattering implantation method. Less
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辻 博司: "負重イオンビームの電子離脱断面積と二次電子放出比" アイオニクス. 第20巻. 41-50 (1994)
Hiroshi Tsuji:“负重离子束的电子脱离截面和二次电子发射率” Ionics Vol. 20. 41-50 (1994)
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通讯作者:
辻 博司、富田哲生、豊田啓孝、後藤康仁、石川順三: "高周波プラズマスパッタ型負重イオン源におけるSF_6ガスからのフッ素負イオン引き出し" 真空. 第38巻. 769 (1995)
Hiroshi Tsuji、Tetsuo Tomita、Hirotaka Toyoda、Yasuhito Goto、Junzo Ishikawa:“在高频等离子体溅射型负重离子源中从 SF_6 气体中提取负氟离子”真空 38. 769 (1995)
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Hiroshi Tsuji: "Development of 200kV Medium Current Negative-Ion Implanter" Proc.of the 5th Symposium on Beam Engineering and Advanced Material Syntheses, BEAMS1994. 23-26 (1994)
Hiroshi Tsuji:“200kV 中电流负离子注入机的开发”第五届梁工程和先进材料合成研讨会论文集,BEAMS1994。
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Hiroshi Tsuji: "Evaluation of Charging Model in Negative-ion Implantation" Journal of the Vacuum Society of Japan. Vol.38, No.3. 224-227 (1995)
Hiroshi Tsuji:“负离子注入中充电模型的评估”日本真空学会杂志。
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Junzo Ishikawa: "Current Status of Material Fabrication Process with Negative-Ion Beam" Ionics. Vol.21, No.4. 5-16 (1995)
Junzo Ishikawa:“负离子束材料制造工艺的现状”离子学。
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共 170 条
Development of Nitride and Carbide Cathodes for Realization of Highly Stable Vacuum Micro Electron Sources
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批准号:12135204
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项目类别:Grant-in-Aid for Scientific Research on Priority Areas
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资助金额:$17.98万
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财政年份:2000
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负责人:ISHIKAWA Junzo
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依托单位:
Ion Beam Processing of Polymeric Biomaterials
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批准号:11694148
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项目类别:Grant-in-Aid for Scientific Research (B).
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资助金额:$3.01万
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财政年份:1999
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负责人:ISHIKAWA Junzo
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依托单位:
Negative-Ion Beam Material Processing Techniques
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批准号:08044140
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项目类别:Grant-in-Aid for international Scientific Research
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资助金额:$3.84万
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财政年份:1996
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负责人:ISHIKAWA Junzo
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依托单位:
Establishment of Charging Free and Non-Scatter Implantation Technology for Micro Powders by Using Negative-Ion Beam
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批准号:08555172
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项目类别:Grant-in-Aid for Scientific Research (A)
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资助金额:$12.74万
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财政年份:1996
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负责人:ISHIKAWA Junzo
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依托单位:
Development of Charge-up Free lon lmplantation by Using Negative lon Beam
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批准号:05555008
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项目类别:Grant-in-Aid for Developmental Scientific Research (B)
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资助金额:$10.62万
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财政年份:1993
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负责人:ISHIKAWA Junzo
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依托单位:
Development of Negative-Ion-Beam Techniques for Film Formation and Crystallinity Control
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批准号:61460065
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项目类别:Grant-in-Aid for General Scientific Research (B)
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资助金额:$4.22万
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财政年份:1986
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负责人:ISHIKAWA Junzo
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依托单位:
海外基金