Development of Negative-Ion-Beam Techniques for Film Formation and Crystallinity Control
Development of Negative-Ion-Beam Techniques for Film Formation and Crystallinity Control
批准号:
61460065
负责人:
ISHIKAWA Junzo
金额:
$4.22万
依托单位:
依托单位国家:
日本
项目类别:
Grant-in-Aid for General Scientific Research (B)
财政年份:
1986
资助国家:
日本
项目状态:
已结题
起止时间:
1986 至 1987
中文摘要
In this研究项目,two application apparatuses of negative ion beam被开发,and negative-ion-beam techniques for film formation and crystallinity control also developed byusing these apparatuses. From invesigation in this projectmany important results已确定.A negative ion beam deposition system已建立combination of a high-current heavy negative ion source (NIABNIS)which was already developed by the authors, a mass-separatorand a newly designed deceleration electrode and lens system. Thw deposition system could deliver asufficient amount of negative ions with a quite low energy controlled precisely for film formation.Carbon films were prepared with a mass-separated pure C^- or C2^- ion beam at various beam energycarbon films,用于投资电影的properties, such as optical band gap,electrical resistivity, atomic adensity,热条件depend upon a negative-ion-beam energy and ion species. .这些dependencies是决定的,因为它考虑到从一个能源强度。to a local area of a substrate by ion beam, and from a displacement probability of the film by it,or from a binding state (electron configuration) ofion species.On the other hand,a negative ion implanter was constructed. By using this implanter,fundamental properties such as ion projection range and distribution of implanted atoms for nagativeimplantation were conventional to be predicted with the LSS's theory as well as for a conventionalpositive ion implantation. Then,a crystallinity of implanted layer formed by C^- ion beam was investigated. After annealing thelayer at 925c during 20 minutesBETA-SiC bond was formed in the layer.Electron detachment cross sections for heavy negative ionbeams were investigated as an interaction of negative ions with gas particles. This phenomenon isfundamental and important for pure physics,and such information is also important for technology and is required for designing an apparatus ofnegative ion beam. Less
英文摘要
In this research project, two application apparatuses of negative ion beam were developed, and negative-ion-beam techniques for film formation and crystallinity control were also developed by using these apparatuses. From invesigation in this project, many important results were obtained.A negative ion beam deposition system has been constructed by combination of a high-current heavy negative ion source (NIABNIS), which was already developed by the authors, a mass-separator, and a newly designed deceleration electrode and lens system. Thw deposition system could deliver a sufficient amount of negative ions with a quite low energy controlled precisely for film formation. Carbon films were prepared with a mass-separated pure C^- or C2^- ion beam at various beam energy for investigating properties of the film. The properties of carbon films, such as optical band gap, electrical resistivity, atomic adensity, and thermal conductivity, depend upon a negative-ion-beam energy and ion species. … More These dependencies were considered to result from an energy density. which is deposited to a local area of a substrate by ion beam, and from a displacement probability of the film by it, or from a binding state (electron configuration) ofion species.On the other hand, a negative ion implanter was also constructed. By using this implanter, fundamental properties such as ion projection range and distribution of implanted atoms for nagative ion implantation were confirmed to be predicted with the LSS's theory as well as for a conventional positive ion implantation. Then, a crystallinity of implanted layer formed by C^- ion beam was investigated. After annealing the layer at 925゜C during 20 minutes, BETA-SiC bond was formed in the layer.Electron detachment cross sections for heavy negative ion beams were investigated as an interaction of negative ions with gas particles. This phenomenon is fundamental and important for pure physics, and such information is also important for technology and is required for designing an apparatus of negative ion beam. Less
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J. Ishikawa: Rev. Sci. Instrum.57. 449-456 (1986)
J. 石川:Rev. Sci。
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石川順三: "イオン源工学" アイオニクス社, 547 (1986)
石川纯三:《离子源工程》Ionics,547 (1986)
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J. Ishikawa: "Neutral and Ionized Alkaline Metal Bombardment Type Heavy Negative Ion Source ( NIABNIS )" Vacuum ( Special issue, Proc. of 4th Intern. Conf. on Low Energy Ion Beams, Brighton, U.K. 1986 ). 36. 887-890 (1986)
J. Ishikawa:“中性和电离碱金属轰击型重负离子源 (NIABNIS)”真空(特刊,Proc. of 4th Intern. Conf. on Low Energy Ion Beams,布莱顿,英国 1986)。
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J. Ishikawa: J. Appl. Phys.61. 2509-2515 (1987)
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共 19 条
Development of Nitride and Carbide Cathodes for Realization of Highly Stable Vacuum Micro Electron Sources
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批准号:12135204
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项目类别:Grant-in-Aid for Scientific Research on Priority Areas
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资助金额:$17.98万
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财政年份:2000
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负责人:ISHIKAWA Junzo
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依托单位:
Ion Beam Processing of Polymeric Biomaterials
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批准号:11694148
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项目类别:Grant-in-Aid for Scientific Research (B).
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资助金额:$3.01万
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财政年份:1999
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负责人:ISHIKAWA Junzo
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依托单位:
Negative-Ion Beam Material Processing Techniques
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批准号:08044140
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项目类别:Grant-in-Aid for international Scientific Research
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资助金额:$3.84万
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财政年份:1996
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负责人:ISHIKAWA Junzo
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依托单位:
Establishment of Charging Free and Non-Scatter Implantation Technology for Micro Powders by Using Negative-Ion Beam
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批准号:08555172
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项目类别:Grant-in-Aid for Scientific Research (A)
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资助金额:$12.74万
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财政年份:1996
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负责人:ISHIKAWA Junzo
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依托单位:
Development of Charge-up Free lon lmplantation by Using Negative lon Beam
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批准号:05555008
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项目类别:Grant-in-Aid for Developmental Scientific Research (B)
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资助金额:$10.62万
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财政年份:1993
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负责人:ISHIKAWA Junzo
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依托单位:
Establishment of the Negative-Ion Beam Technology for Material Modification
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批准号:05402027
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项目类别:Grant-in-Aid for General Scientific Research (A)
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资助金额:$19.2万
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财政年份:1993
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负责人:ISHIKAWA Junzo
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依托单位:
海外基金