Silicon Accelerometer for high temperature applications with Double SOI structure
Silicon Accelerometer for high temperature applications with Double SOI structure
批准号:
06555102
负责人:
ISHIDA Makoto
金额:
$6.46万
依托单位国家:
日本
项目类别:
Grant-in-Aid for Developmental Scientific Research (B)
财政年份:
1994
资助国家:
日本
项目状态:
已结题
起止时间:
1994 至 1995
中文摘要
本研究采用SOI结构和微机械加工技术,研制了一种高温加速度计。首先,利用超高真空化学气相沉积(UHV-CVD)和热壁加热系统生长了双SOI结构[Si/Al203/Si]。生长在Si(100)衬底上的Al203(100)外延薄膜可用作SOI器件的刻蚀阻止层和电隔离层。开发了SOI器件的另一项重要技术:一种是利用硅离子注入方法对化学稳定的A1203薄膜和蓝宝石晶片进行刻蚀的新方法;另一种是利用电子束辐照方法在Al203(100)上选择性外延生长Si(100)以形成精细图形的方法。在此基础上,利用ANSYS有限元软件设计了一种新型压阻式硅加速度计和一种电容式加速度计,并采用微机械加工技术和集成电路技术对其进行了加工。该加速度计可以检测三维加速度。其次,研制了一套高达400゚C的高温测试系统,并对加速度计的性能进行了评估。该加速度计在高达400゚C的温度下稳定工作,证实了SOI结构极大地改善了其高温特性。并将其温度特性和输出特性与模拟结果进行了比较,两者吻合较好。
英文摘要
In this study, an accelerometers for high temperature application have been developed using SOI structure and micromachining technology. At first, an ultrahigh-vacuum chemical vapor deposition (UHV-CVD) with a hot wall heating system have developed to grow double SOI structure [Si/Al203/Si]. The epitaxial Al203 (100) film grown on a Si (100) substrate can be used as etching stop layr and as an electric-isolation layr of an SOI device. Another important technologies for the SOI devices were developed : the one is a new etching method of chemically stable A1203 films and sapphire wafers by Si ion implantation method, and the another is the selective epitaxial growth of Si (100) on Al203 (100) by electron-beam-irradiation method to make fine pattern. As the result, the fundamental technologies for double SOI structure has been developed for accelerometers for high temperature applications.Then, a novel piezoresistive silicon accelerometer and a capacitive accelerometer were designed with finite element method (FEM) of ANSYS.These acoelerometers were fabricated with micromachining technology and integrated circuit technology. The accelerometers can be detect three dimensional acceleration. Next, a package and a measurement system for high temperature up to 400゚C were developed, and the characteristics of accelerometers were evaluated. The accelerometer successfully worked at up to 400゚C stably, so that it was confirmed that the SOI structure greatly improve the characteristics at high temperature. The temperature characteristics and the output characteristics were compared with simulated result, and it well agrees with simulated result.
期刊论文(59)
专著(0)
科研奖励(0)
会议论文
登录
查看更多内容
K.Hayama: "Effect of oxygen radicals for epitaxial growth of Al_2O_3 on Si" Jpn.J.Appl.Phys.33 No.1. 496-499 (1994)
K.Hayama:“氧自由基对 Si 上 Al_2O_3 外延生长的影响”Jpn.J.Appl.Phys.33 No.1。
DOI:
--
发表时间:
期刊:
影响因子:
--
作者:
[]
通讯作者:
H.Takao: "Three dimensional vectro accelerometer using SOI structure for high temperature" Pro. of the 8th Int. Conf. on Solid-State Sensors and Actators. 683-686 (1995)
H.Takao:“采用 SOI 结构的高温三维矢量加速度计”Pro。
DOI:
--
发表时间:
期刊:
影响因子:
--
作者:
[]
通讯作者:
M.Ishida: "A new etching method of single crystal Al2O3 film on Si using Si ion implantation" Proc. Of the 8th Int. Conf. On Solid-State Sensor and Actators. 87-90 (1995)
M.Ishida:“利用硅离子注入在硅上刻蚀单晶 Al2O3 薄膜的新方法”Proc.
DOI:
--
发表时间:
期刊:
影响因子:
--
作者:
[]
通讯作者:
M.Ishida, Y.T.Lee, T.Higashino, H.D.Seo and T.Nakamunr: "Double SOI Structures and Devoce Applications with Heteroepitaxial Al203 and Si" Jpn.J.Appl.Phys.34. 832-836 (1995)
M.Ishida、Y.T.Lee、T.Higashino、H.D.Seo 和 T.Nakamunr:“异质外延 Al2O3 和 Si 的双 SOI 结构和 Devoce 应用”Jpn.J.Appl.Phys.34。
DOI:
--
发表时间:
期刊:
影响因子:
--
作者:
[]
通讯作者:
H.Wadao, T.Shimizu, M.Ishida and T.Nakamura: "The growth properties of SiGe Films on Si (100) using Si2H6 gas and Ge Solid Source Molecular Beam Epitaxy" J.Gryst.Growth. 147. 320-325 (1995)
H.Wadao、T.Shimizu、M.Ishida 和 T.Nakamura:“使用 Si2H6 气体和 Ge 固体源分子束外延在 Si (100) 上生长 SiGe 薄膜的特性”J.Gryst.Growth。
DOI:
--
发表时间:
期刊:
影响因子:
--
作者:
[]
通讯作者:
共 50 条
The Future of the Legal Regulations on Labor Supply Contracts from Historical Perspective
-
批准号:17K03413
-
项目类别:Grant-in-Aid for Scientific Research (C)
-
资助金额:$2.75万
-
财政年份:2017
-
负责人:ISHIDA Makoto
-
依托单位:
Historical and Comparative Study on the Legal Regulation of Labor Supply Contracts in Japan and UK
-
批准号:26380083
-
项目类别:Grant-in-Aid for Scientific Research (C)
-
资助金额:$2.75万
-
财政年份:2014
-
负责人:ISHIDA Makoto
-
依托单位:
An implantable chip with integrated microprobe/tube arrays for electrical neural recording, stimulation, and drug delivery applications
-
批准号:20226010
-
项目类别:Grant-in-Aid for Scientific Research (S)
-
资助金额:$134.7万
-
财政年份:2008
-
负责人:ISHIDA Makoto
-
依托单位:
Three-dimensional epitaxial silicon microprobe array integrated on highly functional smart sensing chip
-
批准号:17206038
-
项目类别:Grant-in-Aid for Scientific Research (A)
-
资助金额:$32.12万
-
财政年份:2005
-
负责人:ISHIDA Makoto
-
依托单位:
The Changes in Enterprise Organization and Labor Law in Japan
-
批准号:15530045
-
项目类别:Grant-in-Aid for Scientific Research (C)
-
资助金额:$1.79万
-
财政年份:2003
-
负责人:ISHIDA Makoto
-
依托单位:
SMART MICRO CHIP BY SELECTIVE GROWN Si-MICROPROBE ELECTRODE ARRAY ON INTEGRATED CIRCUIT
-
批准号:14205044
-
项目类别:Grant-in-Aid for Scientific Research (A)
-
资助金额:$31.03万
-
财政年份:2002
-
负责人:ISHIDA Makoto
-
依托单位:
Substrate using epitaxial Al_2O_3 film for hetero-epitaxial growth and device applications
-
批准号:13555093
-
项目类别:Grant-in-Aid for Scientific Research (B)
-
资助金额:$8.64万
-
财政年份:2001
-
负责人:ISHIDA Makoto
-
依托单位:
Aurora2 protein regulated by the anaphase-promoting complex-ubiquitin-proteasome pathway.
-
批准号:12671214
-
项目类别:Grant-in-Aid for Scientific Research (C)
-
资助金额:$1.73万
-
财政年份:2000
-
负责人:ISHIDA Makoto
-
依托单位:
FUNDAMENTAL RESEARCH FOR QUANTUM DEVICES CONSTRUCTED WITH MULTI-LAYERS OF VERY THIN EPITAXIAL Al2O3 AND Si
-
批准号:10450118
-
项目类别:Grant-in-Aid for Scientific Research (B).
-
资助金额:$2.05万
-
财政年份:1998
-
负责人:ISHIDA Makoto
-
依托单位:
High-quality Si thin film growth on single-crystalline Al203 films
-
批准号:08455144
-
项目类别:Grant-in-Aid for Scientific Research (B)
-
资助金额:$5.06万
-
财政年份:1996
-
负责人:ISHIDA Makoto
-
依托单位:
Basic research on selective epitaxy in very limited areas
-
批准号:06452216
-
项目类别:Grant-in-Aid for General Scientific Research (B)
-
资助金额:$4.1万
-
财政年份:1994
-
负责人:ISHIDA Makoto
-
依托单位:
In-situ Si selective-epitaxial grown SOI structures using Electron beam graphic system
-
批准号:03452155
-
项目类别:Grant-in-Aid for General Scientific Research (B)
-
资助金额:$4.42万
-
财政年份:1991
-
负责人:ISHIDA Makoto
-
依托单位:
海外基金