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Recognition of atomic species on hetero-surfaces by atom resolved tunneling spectroscopy

通过原子分辨隧道光谱识别异质表面上的原子种类

基本信息

批准号：
07405003
负责人：
TOMITORI Masahiko
金额：
$ 21.06万
依托单位：
Japan Advanced Institute of Science and Technology
依托单位国家：
日本
项目类别：
Grant-in-Aid for Scientific Research (A)
财政年份：
1995
资助国家：
日本
起止时间：
1995 至 1997
项目状态：
已结题

来源：
https://kaken.nii.ac.jp/grant/KAKENHI-PROJECT-07405003/
关键词：
atom resolved tunneling spectroscopy [111] -orented W tip scanning tunneling microscopy scanning tunneling spectroscopy build-up field emission microscope silicon germanium 電界イオン顕微鏡 [III]方位W探針 build‐up処理

项目摘要

The purpose of this study is to improve the reproducibility of scanning tunneling spectroscopy (STS) with an atomic resolution, which is called the atom resolved tunneling spectroscopy (ARTS). Since, in general, the electronic states of surfaces with various elements are locally settled by the characteristics of individual atoms on the surface, some changes in electronic states at each atomic site are possibly induced more or less. Consequently, it is expected that atomic species on sample surfaces with hybrid compositions can be recognized with an atomic resolution by prudent inspection with scanning tunneling microscopy (STM) /STS.The key point to achieve the recognition of surface atoms lies on the sharpness and electronic states at a tip apex, because the images obtained by the STS are altered by the tip conditions, easily and seriously.In this study, we have applied a build-up tip of [111] -oriented W for the ARTS of Si and Ge. The tip was treated under conditions of high temperat … More ure and high electric field. By the treatment the tip apex was surrounded by three {112} facets, and then the apex with the [111] orientation became sharper as a corner of the three facets. Furthermore, the treatment can remove impurity atoms not only from the tip apex, but also from the tip shank. Thus the sharpness and electronic states at tip apex can be reproduced by treatment. Then we have demonstrated the reproducibility of ARTS for Si (111) 7x7. The atomic change of the tip apex after the experiment was inspected by field emission microscope (FEM).Moreover, a new instrument combined with an atomic force microscope (AFM) and an electron energy analyzer has been developed to seek other possibilities of atom recognition on surfaces. The tip for AFM was treated to be cleaned and sharpened, and evaluated. By the energy analyzer, we have obtained backscattered electron energy spectra from the Si (111) surface exited by the field emission electron from the build-up tip, which showed bulk plasmon losses and an Auger peak of Si LVV.This results have demonstrated the availability of the combined new instrument for the atom recognition. Less

本研究的目的是提高原子分辨率的扫描隧道光谱（STS）的重复性，称之为原子分辨隧道光谱（ARTS）。一般来说，由于具有各种元素的表面的电子状态由表面上的单个原子的特性局部地确定，因此可能或多或少地诱导每个原子位置处的电子状态的一些变化。期望通过扫描隧道显微镜（STM）的谨慎检查，可以以原子分辨率识别具有混合组成的样品表面上的原子种类。STS.实现表面原子识别的关键在于针尖尖端的清晰度和电子态，因为STS获得的图像容易受到针尖条件的严重影响。尖端在高温条件下处理， ...更多信息高电场。通过处理，尖端顶点被三个{112}小平面包围，然后具有[111]取向的顶点作为三个小平面的拐角变得更尖锐。此外，该处理不仅可以从尖端尖端去除杂质原子，而且还可以从尖端柄部去除杂质原子。因此，尖端尖端的锐度和电子状态可以通过处理再现。然后我们证明了对Si（111）7 × 7的ARTS的再现性。利用场发射显微镜（FEM）观察了实验后针尖上原子的变化，并将原子力显微镜（AFM）和电子能量分析仪相结合，开发了一种新的仪器，以探索表面原子识别的其他可能性。对AFM针尖进行清洁和锐化处理，并进行评价。利用能量分析仪，我们获得了组装针尖场发射电子激发的Si（111）表面背散射电子能谱，显示了体等离子体损失和Si LVV的俄歇峰，证明了组合新仪器用于原子识别的有效性。少