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In-situ observation and analysis of nano contacts and junctions formation at high temperatures by a combined microscope of SEM and SPM

In-situ observation and analysis of nano contacts and junctions formation at high temperatures by a combined microscope of SEM and SPM
SEM和SPM组合显微镜对高温下纳米接触和结形成的原位观察和分析
批准号:
22656012
负责人:
TOMITORI Masahiko
金额:
$2.41万
依托单位国家:
日本
项目类别:
Grant-in-Aid for Challenging Exploratory Research
财政年份:
2010
资助国家:
日本
项目状态:
已结题
起止时间:
2010 至 2012

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项目成果

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中文摘要
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英文摘要
The purpose of this study is to observe and analyze nano contacts and junctions, which are fabricated by bringing two small pieces of materials in proximity or in touch at high temperatures using scanning probe microscopy (SPM) techniques; the techniques can control the separation between them on a nano scale. We successfully demonstrated the approaching, contacting and welding between the two pieces, observed by an ultra-high resolution field-emission scanning electron microscope combined with a home-made pencil-type SPM.
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会议论文
ナノ評価のための走査型プローブ顕微鏡法の概説と最近の話題
用于纳米评估的扫描探针显微镜概述和最新主题
DOI: --
发表时间:
期刊: 色材協会誌 (in print)
影响因子: --
作者: [S.Kondo, H.Kondo, M.Hiramatsu, M.Sekine, M.Hori, Sumito Tsunegi, 富取正彦]
通讯作者: 富取正彦
Improvement of the Q factor of a tuning fork quartz force sensor with modified holding ways for nc-AFM/STM
改进 nc-AFM/STM 固定方式的音叉石英力传感器 Q 值的提高
DOI: --
发表时间: 2012
期刊:
影响因子: --
作者: [Toyoko Arai, Hiroaki Ooe, Tatsuya Sakuishi, Masahiko Tomitori]
通讯作者: Masahiko Tomitori
Local interaction imaging by SiGe quantum dot probe
SiGe量子点探针局部相互作用成像
DOI: --
发表时间: 2012
期刊: Curr. Appl. Phys
影响因子: --
作者: [Y. Jeong, M. Hirade, R. Kokawa, H. Yamada, K. Kobayashi, N. Oyabu, T. Arai, A. Sasahara, and M. Tomitori]
通讯作者: and M. Tomitori
Akira Sasahara and Masahiko Tomitori
笹原晃和富鸟正彦
DOI: --
发表时间: 2012
期刊: Local interaction imaging by SiGe quantum dot probe, Current Appl
影响因子: --
作者: [Yonkil Jeong, Masato Hirade, Ryohei Kokawa, Hirofumi Yamada, Kei Kobayashi, Noriaki Oyabu, Toyoko Arai]
通讯作者: Toyoko Arai
17
    Analysis of binding formation between solid surfaces by bias voltage non-contact atomic force microscopy/spectroscopy
    Measurements of electronic properties of interfaces with functional nanostructures by bias-voltage non-contact atomic force microscopy/spectroscopy
    Study of electric field close to a sample surface utilizing the electron standing wave excited in a vacuum gap of scanning tunneling microscopy
    Development of a field electron emission-scanning probe microscope with a build-up tip
    海外基金