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Development of Atomically Controlling CVD Apparatus for Fabrication of Si-Based Superlattice Devices

Development of Atomically Controlling CVD Apparatus for Fabrication of Si-Based Superlattice Devices
用于制造硅基超晶格器件的原子控制CVD设备的开发
批准号:
07555409
负责人:
MUROTA Junichi
金额:
$2.11万
依托单位:
依托单位国家:
日本
项目类别:
Grant-in-Aid for Scientific Research (A)
财政年份:
1995
资助国家:
日本
项目状态:
已结题
起止时间:
1995 至 1997

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项目成果

MUROTA Junichi的其他基金

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中文摘要
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英文摘要
In this scientific research, to develop ultimate ultra small structure process technology, we have aimed at establishing the Si-based atomically controlling CVD technology which is applicable for device fabrication and in which atomic layr mixing is suppressed by combining a flash heating CVD method and surface treatment with plasma irradiation etc.Moreover, we have investigated elucidation and formulation of low temperature surface adsorption and reaction process of Si-Ge-C,Si-N and W systems.As to the Si-Ge system, we have achieved atomic layr-by-layr growth of Si and Ge, and fabricated double-barrier resonant tunneling diodes and observed negative resistance. Moreover, in high concentration impurity doping of P and B into SiGe, we have discussed and formulated the adsorption and reaction process by modified Langmuir-type equations considering the surface bond sites. As to the Si-C system, we have achieved atomic-layr carbonization of Si (100) by CH_4 at 500-600゚C and clarified that … More the carbon amount depends on the surface impinging CH_4 molecules based on Langmuir-type equations. As to the Si-N system, we have achieved atomic-layr nitridation of Si (100) by NH_3 at 400゚C and clarified that the nitrogen amount depends on Langmuir-type adsorption and reaction equations considering desorption. As to low temperature selective deposition mechanism of W is also discussed based on the surface treatment by a preheating method and alternating supply of WF_6 and SiH_4 Furthermore, by using an ECR plasma, we achieved atomic-layr etching of Si, Ge, SiGe and silicon nitride and analyzed the adsorption and reaction process by considering Langmuir-type simple formalism.Atomically controlling CVD of Si, Ge, etc., is increasingly important technology, because of compatibility with integrated circuits and also because it has potential application to create artificial atomic stacking structures similar to the compound semiconductor structure by using the group IV elements which have been used as an elemental semiconductor. The success of this research project supplies a fundamental key to ultra small device fabrication technology with group IV semiconductors. Less
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会议论文
S. Kobayashi,: ""Initial Growth Characteristics of Germanium on Silicon in LPCVD Using Germane Gas"," The 9th International Conference on Vapor Growth & Epitaxy. 116 (1996)
S. Kobayashi,:“使用锗气体的 LPCVD 中硅上锗的初始生长特性”,第九届国际气相生长会议
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通讯作者:
M. Sakuraba,: ""H-Termination on Ge (100) and Si (100) by Diluted HF Dipping and by Annealing in H_2"" 5th International Symposium on Cleaning Technology in Semiconductor Device Manufacturing,. (in press). (1997)
M. Sakuraba,:“通过稀释的 HF 浸渍和 H_2 退火对 Ge (100) 和 Si (100) 进行 H 终止”,第五届半导体器件制造清洁技术国际研讨会。
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Y.Yamoto et.al.: "Surface Reaction of Altermately Supplied WF_6and SiH_4 Gases" Surf.Sci.,. (in press)(印刷中). (1998)
Y.Yamoto 等人:“交替供应的 WF_6 和 SiH_4 气体的表面反应”Surf.Sci.,(出版中)。
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通讯作者:
C.J.Lee, at al: "Phosphorus Doping Effect on Si_<1-x>Ge_x Epitaxial Film Growth in the SiH_4-GeH_4-PH_3 Gas System Using Ultraclean LPCVD" CVD XIV. PV97-25. 1356-1363 (1997)
C.J.Lee 等人:“使用超净 LPCVD 的 SiH_4-GeH_4-PH_3 气体系统中的磷掺杂对 Si_<1-x>Ge_x 外延薄膜生长的影响”CVD XIV。
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70
    Creation of High-Carrier-Concentration and High-Mobility Artificial Crystal of Group IV Semiconductors by Atomically Controlled CVD Processing
    • 批准号:
      19206032
    • 项目类别:
      Grant-in-Aid for Scientific Research (A)
    • 资助金额:
      $30.45万
    • 财政年份:
      2007
    • 负责人:
      MUROTA Junichi
    • 依托单位:
    Creation of Artificial Crystal with Atomically-Controlled Group-IV Semiconductor Heterostructures
    • 批准号:
      15206031
    • 项目类别:
      Grant-in-Aid for Scientific Research (A)
    • 资助金额:
      $31.87万
    • 财政年份:
      2003
    • 负责人:
      MUROTA Junichi
    • 依托单位:
    Formation of Very Low Contact Resistance between Metal and Semiconductor using Semiconductor Structures with Ultra High Carrier Concentration
    • 批准号:
      13355013
    • 项目类别:
      Grant-in-Aid for Scientific Research (A)
    • 资助金额:
      $27.71万
    • 财政年份:
      2001
    • 负责人:
      MUROTA Junichi
    • 依托单位:
    Development of SiGe System MOS-HBT Technology for Fabrication of High Integrated Communication System
    • 批准号:
      11694123
    • 项目类别:
      Grant-in-Aid for Scientific Research (B)
    • 资助金额:
      $4.86万
    • 财政年份:
      1999
    • 负责人:
      MUROTA Junichi
    • 依托单位: