Study on a new method of X-ray stress measurement using two dimensional X-ray detector

这项研究是为了探讨通过分析整个德拜-谢勒环进行X射线应力测量的可能性。为了获得高精度和高效率的X射线检测，使用了成像板(IP)。通过对田中方法的研究，我们提出了新的sigma_y和tau_&lt；xy&gt；我们还发现，田中的方法涉及到角ETA为常数的假设。因此，我们提出了一种新的方法来确定德拜-谢勒环的应力，而不是上述关于角ETA的近似。为了进行实验，研制了一套用于激电材料的四点弯曲装置的图像数据处理、应力计算和背反射式劳厄相机系统。将该装置机械施加的应力与本方法的应力进行了比较。结果表明，用Sin^2psi方法可以得到与之相同精度的应力。这种方法的优点是在单次入射X射线的情况下，从一个衍射环就可以得到平面应力状态下的所有三个应力分量。

This study was performed to examine the possibility of the X-ray stress measurement by analyzing whole Debye-Scherrer ring. An imaging plate (IP) was used for the detection of X-ray in order to obtain a high degree of accuracy and efficiency. Through the investigation on the Tanaka's method, we proposed new equations for sigma_y and tau_<xy>. We also found that the Tanaka's method involved an assumption that the angle eta was constant. So we proposed a new method for the determination of stresses from Debye-Scherrer ring without the above approximation on angle eta. For the experiment, a new system of processing image data, calculating stresses and back-reflection Laue camera for IP with a four-point-bending-device was manufactured. The stress applied mechanically with this device was compared to that from the present method. The result showed that it was possible to obtain the stress with the same accuracy as that by the sin^2psi method. The advantage of this method is that one can obtain all three components of the stress in plane stress state from one diffraction ring with single incidence of X-ray beam.