Development of a Measuring Apparatus for Profile and dimension of Micro Parts

微型零件外形尺寸测量仪的研制

基本信息

  • 批准号:
    10650121
  • 负责人:
  • 金额:
    $ 2.24万
  • 依托单位:
  • 依托单位国家:
    日本
  • 项目类别:
    Grant-in-Aid for Scientific Research (C)
  • 财政年份:
    1998
  • 资助国家:
    日本
  • 起止时间:
    1998 至 1999
  • 项目状态:
    已结题

项目摘要

For the inspection and measurement of micro parts, measuring methods for the profile and dimension including geometrical deviations such as straightness, circularity and perpendicularity are needed. It is thought that a small three-dimensional profile measuring apparatus with microprobe can be utilized as the measuring method for this purpose. In this research a new three-dimensional profile measuring apparatus which has non-contact probe detecting proximity to measuring object through tunneling effect is described in detail. Then the validity of the measuring apparatus is shown through several specimens like roughness standard, micro hole and groove.Tunnel effect is observed when gap between surface and probe is less than 1 nm. In this research the tunnel effect is used to detect the contact of prove and surface, because no complicated devices are needed and measurement on the sloping surface is possible.The trial apparatus is composed of X-Y-Z precision stages with linear encoders, θ (rotating) stage with rotary encoder and a personal computer controlling these stages through GP-IB interface. The probe is mounted to Z stage through piezo electric actuators so that it must be precisely controlled.The probes are most important components of this measuring method. Fabrication method of probes suitable for measurement of each microparts by micro die-sinking electro discharge machining has also been developed.
在微小型零件的检测中,需要对微小型零件的轮廓和尺寸进行测量,包括直线度、圆度、不规则度等几何误差的测量。认为可以利用带有微探针的小型三维轮廓测量装置作为用于此目的的测量方法。本文详细介绍了一种新型的三维轮廓测量装置,该装置采用非接触式测头,通过隧道效应检测被测物体的接近程度。通过对粗糙度标准件、微孔和沟槽的测试,验证了该测量装置的有效性,当探针与表面之间的间隙小于1 nm时,观察到隧道效应。本研究利用隧道效应来检测试样与表面的接触,不需要复杂的测量装置,可以在倾斜表面上进行测量,实验装置由带有直线编码器的X-Y-Z精密工作台、带有旋转编码器的θ(旋转)工作台和通过GP-IB接口控制这些工作台的PC机组成。测头通过压电驱动器安装在Z工作台上,因此必须对其进行精确控制,测头是这种测量方法的最重要组成部分。还开发了适用于各种微小型零件测量的微模具电火花加工探针的制作方法。

项目成果

期刊论文数量(10)
专著数量(0)
科研奖励数量(0)
会议论文数量(0)
专利数量(0)
Toshiharu Shiraishi and Kimiyuki Mitsui: "Development of Three Dimensional Profile Measuring Apparatus for Microparts -Measuring Principle and Measuring Results-"J.of the JSPE. 64-9. 1395-1399 (1998)
Toshiharu Shiraishi和Kimiyuki Mitsui:“微型零件三维轮廓测量仪的开发-测量原理和测量结果-”JSPE杂志。
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    0
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Kimiyuki Mitsui: "Development of three-dimensional Profile Measuring Method for Microparts"Proceedings of ASPE 1999 Annual Meeting. 320-323 (1999)
Kimiyuki Mitsui:“微型零件三维轮廓测量方法的开发”ASPE 1999年年会论文集。
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    0
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谷村尚、山口哲司、三井公之: "微細形彫放電加工によるマイクロ部品形状測定用探針の製作-X型及びX-Z型探針の製作-"精密工学会誌. 65-9. 1296-1300 (1999)
Takashi Tanimura、Tetsuji Yamaguchi、Kimiyuki Mitsui:“通过精细开模放电加工测量微型零件形状的探针的制作 - X 型和 X-Z 型探针的制作 -” 日本精密工程学会杂志65-9。1296-1300(1999)
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    0
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Hisashi Tanimura, Tetsuji Yamaguchi and Kimiyuki Mitsui: "Fabrication of Probes for Profile Measurement of Microparts by Micro Die-sinking EDM"J.of the JSPE. 65-9. 1296-1300 (1999)
Hisashi Tanimura、Tetsuji Yamaguchi 和 Kimiyuki Mitsui:“利用微型电火花放电加工对微型零件进行轮廓测量的探针的制作”J. of JSPE。
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    0
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白石利治,三井公之: "マイクロ部品用形状測定装置の開発-装置の構成ならびに測定結果-"精密工学会誌. 64-9. 1395-1399 (1998)
Toshiharu Shiraishi、Kimiyuki Mitsui:“微型零件形状测量装置的开发 - 装置配置和测量结果”日本精密工程学会杂志 64-9 (1998)。
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    0
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MITSUI Kimiyuki其他文献

MITSUI Kimiyuki的其他文献

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{{ truncateString('MITSUI Kimiyuki', 18)}}的其他基金

Study on vibration assisted micro-EDM and its machining condition monitoring
振动辅助微细电火花加工及其加工状态监测研究
  • 批准号:
    19560123
  • 财政年份:
    2007
  • 资助金额:
    $ 2.24万
  • 项目类别:
    Grant-in-Aid for Scientific Research (C)
Development of an optical measuring method for rotational accuracy of micro-spindle
微主轴旋转精度光学测量方法的研制
  • 批准号:
    14550106
  • 财政年份:
    2002
  • 资助金额:
    $ 2.24万
  • 项目类别:
    Grant-in-Aid for Scientific Research (C)
Development of optical probe for shapes and dimension measurement of micro-parts
开发用于微型零件形状和尺寸测量的光学探针
  • 批准号:
    12650121
  • 财政年份:
    2000
  • 资助金额:
    $ 2.24万
  • 项目类别:
    Grant-in-Aid for Scientific Research (C)
Development of a new displacement-measuring ultrasonic sensor based on astigmatic focus error detection
基于像散聚焦误差检测的新型位移测量超声波传感器的研制
  • 批准号:
    08555039
  • 财政年份:
    1996
  • 资助金额:
    $ 2.24万
  • 项目类别:
    Grant-in-Aid for Scientific Research (A)
Long Depth of a Focus Optical Microscopy Based on Computer Image Processing
基于计算机图像处理的长焦深光学显微镜
  • 批准号:
    06452163
  • 财政年份:
    1994
  • 资助金额:
    $ 2.24万
  • 项目类别:
    Grant-in-Aid for General Scientific Research (B)
Development of Precision Straightness Measuring System
精密直线度测量系统的开发
  • 批准号:
    02650101
  • 财政年份:
    1990
  • 资助金额:
    $ 2.24万
  • 项目类别:
    Grant-in-Aid for General Scientific Research (C)

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