Optical properties of semiconductor nanostructures studied by in-stu optical spectroscopy in a transmission electron microscope.

我们发展了一种新的透射电子显微镜（TEM）与光谱学相结合的实验方法.在国家助学金的资助下，光学测量仪器有了很大的进步，并可用于偏振测量。从样品的一个小区域发射的光的偏振，这是同时观察到的TEM，现在可以分析。我们应用这种先进的技术研究了Cu-Pt型有序GaInP半导体的发光。我们发现扩展的缺陷，即所谓的反相边界（APB），可以作为量子威尔斯阱，由于带间跃迁而发射出激子光。这项新发现的关键实验数据是，我们已经令人信服地确定，根据阱结构，光是偏振良好的。我们还测量了由我们自己的晶体生长配方生长的硅纳米线发出的光。我们已经观察到了可能是由于量子限制引起的偏振光，尽管还需要大量的定性研究。总之，我们发展了新的实验技术，并证明这非常适合于纳米结构和相关电子结构的研究。该技术将被普遍应用于各种异质纳米结构，最近已经获得了很大的兴趣。

We have developed a new experimental method of transmission electronmicroscopy (TEM) combined with optical spectroscopy. Supported by the Grant-in-Aid, the apparatus for optical measurement has been much advanced, and is available for polarizing measurement. The polarization of light emitted from a small area of specimen, which is simultaneously observed by TEM, can now be analyzed. We have applied this advanced technique to study the light emitted from Cu-Pt type ordered GalnPsemiconductors. We have found that extended defects, so called antiphase boundary (APB) act as quantum wells which emits exitonic light due to interband transition. The key experimental data in this new finding is that we have determined convincingly that the light is well polarized according to the well structures.We have also measured the light emitted from silicon nanowires that were grown by our own recipe of crystal growth. We have observed polarized light presumably due to quantum confinement, even though much qualitative studies is needed.In conclusion, we have developed the new experimental technique, anddemonstrated that this is very much suitable for the studies on nanostructures and associated electronic structures. The techniques will be applied generally to various heterogeneous nanostructures which has gained much interest recently.