Atomic scale monitoring for epitaxial growth process of 3C-SiC on Si
Atomic scale monitoring for epitaxial growth process of 3C-SiC on Si
批准号:
11650028
负责人:
YASUI Kanji
金额:
$2.37万
依托单位国家:
日本
项目类别:
Grant-in-Aid for Scientific Research (C)
财政年份:
1999
资助国家:
日本
项目状态:
已结题
起止时间:
1999 至 2000
中文摘要
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英文摘要
The objective of this project is to understand the reaction processes during the epitaxial growth of 3C-SiC on Si substrates using methylsilanes as source materials in order to realize the low temperature epitaxial growth of SiC with excellent properties.In 1999, from the experiments of crystal growth by low-pressure CVD (LPCVD) and triode plasma CVD using monometylsilane (MMS) as a source gas, the epitaxial growth at 900℃ was successful by triode plasma CVD, while the epitaxial growth was successful at higher temperature than 950℃ by LPCVD.The activation energies of SiC growth were 70kcal/mol in LPCVD and 43kcal/mol in triode plasma CVD, respectively.In 2000, to investigate the growth mechanism of SiC on Si (001) surface, the initial reaction process between dimethylsilane (DMS) and Si (2×1) surface was observed in-situ using reflection high-energy electron diffraction (RHEED). By the DMS supply after raising the substrate temperature to 650-750℃, 3C-SiC spots were observed after incu … More bation time. During the incubation time, Si c(4×4) surface reconstruction was observed. The Si c(4×4) reconstruction was considered to have been a result of the carbon atoms diffused to the Si substrate from adsorbed DMS molecules. The activation energy calculated from the Arrhenius plot of the time until the Si c(4×4) structure appeared was about 16kcal/mol. It was considered that the carbon atoms adsorbed DMS molecules diffused into the Si substrate and formed Si_xC_<1-x> alloys in order to relax the lattice mismatch between Si and SiC during incubation time. The activation energy calculated from the Arrhenius plot on the initial growth rate of SiC formation was about 45kcal/mol. This energy value was close to that of hydrogen desorption from Si surface. In this temperature region, hydrogen atoms of DMS molecules adsorbed on Si surface migrated to Si dangling bonds and thereafter desorbed from Si-H bonds. The hydrogen desorption process from Si surface is considered to be rate-limiting step.Parallel to the above investigation, SiC epitaxial growth was carried out by LPCVD and triode plasma CVD using dimethylsilane as source gas. The activation energies for SiC growth were 90kcal/mol in. In the case of the SiC growth by triode plasma CVD, on the other hand, the activation energy for the epitaxial growth hardly depended on the source materials, i. e. between MMS and DMS. Less
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前田智彦: "トライオードプラズマCVD法によるモノメチルシランを用いたSiCエピタキオシャル成長"第47回応用物理学関係連合講演会予稿. 31pZL-7/II (2000)
Tomohiko Maeda:“通过三极等离子体 CVD 方法使用单甲基硅烷进行 SiC 外延生长”第 47 届应用物理协会会议记录 31pZL-7/II (2000)。
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成田克: "有機ケイ素化合物と水素を用いたβ-SiC成長初期過程、"電子情報通信学会エレクトロニクスソサィエティ大会講演論文集2. 22 (2000)
Masaru Narita:“使用有机硅化合物和氢进行 β-SiC 生长的初始过程”,IEICE 电子学会会议记录 2. 22 (2000)
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Kanji Yasui: "Growth of high quality SiC films on Si by triode plasma CVD using monomethylsilane"Appl.Surf.Sci.. (in press). (2001)
Kanji Yasui:“使用单甲基硅烷通过三极等离子体 CVD 在硅上生长高质量 SiC 薄膜”Appl.Surf.Sci..(出版中)。
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Kanji Yasui: "Growth of high quality SiC films on Si by triode plasma CVD using monomethylsilane"Applied Surface Science. (in press). (2001)
Kanji Yasui:“使用单甲基硅烷通过三极等离子体 CVD 在硅上生长高质量 SiC 薄膜”应用表面科学。
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Kanji Yasui: "Epitaxial Growth of 3C-SiC Films on Si Substrates by Triode Plasma CVD Using dimethylsilane"Applied Surface Science. 159/160. 556-560 (2000)
Kanji Yasui:“使用二甲基硅烷通过三极等离子体 CVD 在硅基板上外延生长 3C-SiC 薄膜”应用表面科学。
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共 16 条
Creation of growth technique for high-quality zinc oxide thin films using catalytically generated high-energy H2O beam
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批准号:24360014
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项目类别:Grant-in-Aid for Scientific Research (B)
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资助金额:$12.4万
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财政年份:2012
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负责人:YASUI Kanji
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财政年份:2012
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依托单位:
Surface reaction process at epitaxial growth of 3C-SiC on Si(001) using organosilicon compounds
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批准号:14550023
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项目类别:Grant-in-Aid for Scientific Research (C)
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资助金额:$2.18万
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财政年份:2002
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负责人:YASUI Kanji
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依托单位:
Low temperature growth of 3C-SiC crystal by hydrogen radical assisted plasma enhanced chemical vapor deposition
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批准号:09650028
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项目类别:Grant-in-Aid for Scientific Research (C)
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财政年份:1997
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负责人:YASUI Kanji
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