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Low temperature growth of 3C-SiC crystal by hydrogen radical assisted plasma enhanced chemical vapor deposition

Low temperature growth of 3C-SiC crystal by hydrogen radical assisted plasma enhanced chemical vapor deposition
氢自由基辅助等离子体增强化学气相沉积低温生长3C-SiC晶体
批准号:
09650028
负责人:
YASUI Kanji
金额:
$1.79万
依托单位国家:
日本
项目类别:
Grant-in-Aid for Scientific Research (C)
财政年份:
1997
资助国家:
日本
项目状态:
已结题
起止时间:
1997 至 1998

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中文摘要
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英文摘要
The objective of this project is to realize the low temperature growth of 3C-SiC and epitaxial growth of it on Si substrates utilizing the hydrogen radicals generated by rf plasma.In 1997, as a result of the experiments of crystal growth by triode plasma CVD method and by hybrid plasma CVD method allow temperature (<1000゚C) using dimethyichiorosilane and dimethylsilane as source gases, it became clear that the triode plasma CVD method using dimethylsilane was effective and the crystal growth at 600゚Cwas possible utilizing the method. The crystal growth of SiC at the low temperature was realized under the conditions of low plasma space potential and low electron temperature (<1eV) in the vicinity of the substrate surface. Reducing the hydrogen ion acceralation at sheath region by the suppression of the rf vibration of plasma space potential , the crystallinity of SiC films was further improved. Epitaxial growth on Si(100) and (111) was also successful at 1000゚C.Using the triode plasma CVD method, the surface morphplogy of SiC films was more satisfactory than that grown by thermal CVD method.In 1998, the conditions of the dilution ratio of source gas by hydrogen and the reaction pressure were extensively controlled using the turbo molecular pump, which has high evacuation rate, for the growth of epitaxial SiC films. As a result of this experiment, highly oriented SiC epitaxial films with best crystallinity were obtained at reaction pressure of 0,3 Torr and at high dilution rate of hydrogen (>200). By changing the hydrogen dilution ratio, the residual stress of SiC on Si (111) was able to vary from coinpresive to tensile. By control the hydrogen dilution ratio, SiC epitaxial film on Si substrates with low residual stress was able to be obtained.
期刊论文(18)
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会议论文
安井寛治: "ジメチルシランを用いたシリコン基板上への3C-SiCエピタキシャル成長" 電子情報通信学会技術研究報告. CPM98・124. 15-20 (1998)
Hiroharu Yasui:“使用二甲基硅烷在硅基板上进行 3C-SiC 外延生长” IEICE 技术报告 15-20 (1998)。
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通讯作者:
Kanji YASUI: "Heteroepitaxy of 3c-SiC using triode plasma enhanced chemical vapor deposition on Si substrates without buffer layer." Appl.Surf.Sci.(in press). (1999)
Kanji YASUI:“使用三极管等离子体增强化学气相沉积在没有缓冲层的硅衬底上进行 3c-SiC 异质外延。”
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通讯作者:
Kanji YASUI: "Heteroepitaxy of 3C-SiC using triode plasma enhanced chemical vapor deposition on Si substrates without buffer layer." Applied Surface Science(in press). (1999)
Kanji YASUI:“使用三极管等离子体增强化学气相沉积在没有缓冲层的硅基板上进行 3C-SiC 异质外延。”
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安井寛治: "有機珪素化合物を用いたトライオードプラズマプラズマCVD法による結晶SiC膜の成長" 電子情報通信学会論文誌. J81-C-II. 122-128 (1998)
Hiroharu Yasui:“使用有机硅化合物通过三极等离子体 CVD 方法生长晶体 SiC 薄膜”,电子、信息和通信工程师学会会刊 J81-C-II(1998 年)。
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18
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