Analysis of a solid-liquid interface by means of an in-situ heating experiment in a HREM/analytical electron microscope

通过原位加热实验，在HREM/分析电镜下研究了固液界面的形貌和结构。完美固体和完美液体之间存在一层中间层，厚度从1层到几层不等。中间层的厚度在晶体生长过程中不断扩大。因此，中间层的动态行为在控制晶体生长机制中起着非常重要的作用。利用EDX和EELS检测了合金元素在固液界面附近的分布。在20nm以下，Bi、In和Al液体团簇的接触角迅速减小。这表明固液界面附近的液体结构可能与buIk液体的结构有很大的不同。总之，本研究为液体透射电镜的研究开辟了新的领域。

The morphology and structures of a solid-liquid interface was studied by means of an in-situ heating experiment in HREM/analytical electron microscopes. There exists an intermediate layer between the perfect solid and perfect liquid, the thickness ranging from 1 to a few monolayers. The intermediate layer expand its thickness during crystal growth. Thus, the dynamic behaviour of the intermediate layer plays a very important role in governing the mechanism of crystal growth. The distribution of alloying elements near the solid-liquid interface was detected by using EDX and EELS. Furthermore, the contact angle of liquid clusters of Bi,In and Al decreases rapidly below 20nm. This suggests that the structure of liquid near the solid-liquid interface can be quite different from that of buIk liquid. In summary the present study has opened a door to the new field of transmission of electron microscopy of liquid.