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Study of the Microstructure of iViaterials by Synchrotron Radiation Wavelength-Modulated Diffraction Method

Study of the Microstructure of iViaterials by Synchrotron Radiation Wavelength-Modulated Diffraction Method
同步辐射波长调制衍射法研究iVaterials的微观结构
批准号:
14550659
负责人:
IWASAKI Hiroshi
金额:
$2.05万
依托单位:
依托单位国家:
日本
项目类别:
Grant-in-Aid for Scientific Research (C)
财政年份:
2002
资助国家:
日本
项目状态:
已结题
起止时间:
2002 至 2003

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英文摘要
We established utilizing the continuous nature of spectrum and the high brightness of synchrotron radiation a new diffraction method "wavelength-modulated diffraction" and showed that it is possible to derive information on the microstructure of materials that is not obtainable by other methods. From the intensity profile of Bragg reflections recorded using radiation of a band of wavelength in the vicinity of the absorption edge of an atom in organic crystal, phases of the structure factors were derived.In the present research, the method has been extended so that parallel radiation beam of a band of wavelength isproduced by reflection by a depth'graded multilayer at the X-ray diffraction beamline at the Ritsumeikan Synchrotron Radiation Center and used to record intensity profiles of Bragg reflections. With a single crystal of a ferrocene derivative known to have an enantiomorphous structure as a sample and the wavelength band set so as to include the absorption edge of the iron atom, clear contrast has been observed at the edge between the Friedel pairs of reflections and the chirality of the structure has been unequivocally determined. It has also been shown that the method has a wide range of application in diffraction crystallography.
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T.Koganezawa, H.Iwasaki, N.Nakamura, Y.Yoshimura, T.Shoji: "A Wide-B andp ass Monochromator and Jts Application to the Determination of Absolute Structure"J.Appl.Cryst.. 37. 136-142 (2004)
T.Koganezawa、H.Iwasaki、N.Nakamura、Y.Yoshimura、T.Shoji:“宽频带单色仪及其在绝对结构测定中的应用”J.Appl.Cryst.. 37. 136-142
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T.Koganezawa: "Phase Determination by Wavelength-Modulated Diffraction. II."Acta Cryst.. A58(Suppl). C84 (2002)
T.Koganezawa:“通过波长调制衍射进行相位测定。II”Acta Cryst.. A58(增刊)。
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T.Koganezawa: "A Diffraction System with an X-ray Beam of a Band of Wavelength"Proc.Intern.Conf.Synchrotron Radiation Instrumentation. (印刷中). (2004)
T. Koganezawa:“具有一定波长带的 X 射线束的衍射系统”Proc.Intern.Conf.Synchrotron Radiation Instrumentation(正在出版)。
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9
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    • 项目类别:
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    • 资助金额:
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    • 项目类别:
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      $2.33万
    • 财政年份:
      2009
    • 负责人:
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    • 依托单位:
    海外基金