Study of the Microstructure of iViaterials by Synchrotron Radiation Wavelength-Modulated Diffraction Method

我们利用光谱的连续性和同步辐射的高亮度，建立了一种新的衍射方法--波长调制衍射法，并证明了可以获得其他方法无法获得的关于材料微观结构的信息。根据有机晶体中原子吸收边附近波长带的辐射记录的布拉格反射的强度分布，推导出结构因子的相位。在本研究中，扩展了该方法，使该波长带的平行辐射束由立命馆同步辐射中心的X射线衍射束线上的深度梯度多层膜反射产生，并用于记录布拉格反射的强度分布。以已知具有同构结构的二茂铁衍生物单晶为样品，并设置了包括铁原子吸收边的波长带，在Friedel反射对的边缘观察到了明显的对比，明确地确定了结构的手性。该方法在衍射结晶学中也有广泛的应用。

We established utilizing the continuous nature of spectrum and the high brightness of synchrotron radiation a new diffraction method "wavelength-modulated diffraction" and showed that it is possible to derive information on the microstructure of materials that is not obtainable by other methods. From the intensity profile of Bragg reflections recorded using radiation of a band of wavelength in the vicinity of the absorption edge of an atom in organic crystal, phases of the structure factors were derived.In the present research, the method has been extended so that parallel radiation beam of a band of wavelength isproduced by reflection by a depth'graded multilayer at the X-ray diffraction beamline at the Ritsumeikan Synchrotron Radiation Center and used to record intensity profiles of Bragg reflections. With a single crystal of a ferrocene derivative known to have an enantiomorphous structure as a sample and the wavelength band set so as to include the absorption edge of the iron atom, clear contrast has been observed at the edge between the Friedel pairs of reflections and the chirality of the structure has been unequivocally determined. It has also been shown that the method has a wide range of application in diffraction crystallography.