课题基金 / 基金详情

Control of single-electron-tunneling characteristics in Si multidot structure for applying to nanodot automaton

Control of single-electron-tunneling characteristics in Si multidot structure for applying to nanodot automaton
硅多点结构中单电子隧道特性的控制及其应用于纳米点自动机
批准号:
15360163
负责人:
IKEDA Hiroya
金额:
$9.98万
依托单位:
依托单位国家:
日本
项目类别:
Grant-in-Aid for Scientific Research (B)
财政年份:
2003
资助国家:
日本
项目状态:
已结题
起止时间:
2003 至 2005

项目摘要

项目成果

IKEDA Hiroya的其他基金

相似基金

相关文献

中文摘要
翻译
点击翻译按钮获取中文摘要
英文摘要
For the application to nanodot automaton and ultimately-low-consumption single-electron memory, we fabricated two-dimensional (2D) Si-multidot-channel field-effect transistors (FETs) and investigated their single-electron/hole-tunneling (SET/SHT) characteristics. In addition, we also simulated the alternative current characteristics of 2D random-multidot FETs for the realization of one-by-one transfer of electrons. The main results from this project are listed below.(1)The fabricated 2D Si-multidot-channel FETs show current oscillation due to the Coulomb blockade (CB) phenomenon below 70K, indicating the realization of SET/SHT. From the SET/SHT characteristics, we concluded that a carrier percolation path between source and drain electrodes, considering a string of dots, namely, a series of tunnel junctions, is formed in the 2D multidot channel, and that the highest-resistance tunnel junctions dominate the carrier transport. Moreover, by illuminating light and by applying side-gate bia … More s, the generation and/or shift of the current peaks were observed. These phenomena can be explained by the model in which the light illumination and side-gate bias supply an additional charge to a dot adjacent to the current percolation path.(2)The current fluctuation in SHT characteristics of the 2D Si-multidot-channel FET was observed in the particular ranges of drain voltage and gate voltage. This phenomenon is attributed to the time-dependent charging-discharging and polarity-switching of the dots adjacent to the current percolation path.(3)By Kelvin-probe force microscopy, we observed directly the carrier flowing in the Si multidot channel during the transistor operation. At room temperature, we successfully imaged the carrier flowing in a part of the channel, for the first time.(4)We investigated numerically the alternating-current characteristics in 2D random-multidot-channel FETs using the CB orthodox theory. It was found that the turnstile operation and single-electron pump operation meaning that electrons are transferred one by one can be performed. These operations can be interpreted using the stability diagram of the multidot FET. Less
期刊论文(13)
专著(0)
科研奖励(0)
会议论文
Numerical study of turnstile operation in random-multidotchannel field-effect transistor
随机多点通道场效应晶体管旋转门操作的数值研究
DOI: --
发表时间: 2006
期刊: J. Appl. Phys. Vol.99
影响因子: --
作者: [H. Ikeda, M. Tabe]
通讯作者: M. Tabe
Current fluctuation in single-hole transport through a two-dimensional Si multidot
通过二维硅多点的单空穴传输的电流波动
DOI: --
发表时间: 2005
期刊: Applied Physics Letters 86・13
影响因子: --
作者: [Ratno Nuryadi, Hiroya Ikeda, Yasuhiko Ishikawa, Michiharu Tabe]
通讯作者: Michiharu Tabe
DOI: --
发表时间: 2004
期刊: Japanese Journal of Applied Physics 43・6B
影响因子: --
作者: [Hiroya Ikeda, Ratno Nuryadi, Yasuhiko Ishikawa, Michiharu Tabe]
通讯作者: Michiharu Tabe
Ambipolar Coulomb Blockade Characteristics in a Two-Dimensional Si Coupled-Dot Device
二维硅耦合点器件中的双极库仑阻塞特性
DOI: --
发表时间: 2003
期刊: IEEE Trans. on Nanotechnology 2
影响因子: --
作者: [R.Nuryadi, H.Ikeda, Y.Ishikawa, M.Tabe]
通讯作者: M.Tabe
7
    Development of nanofreezer substrate for realizing room-temperature operation of single-electron and spin devices
    • 批准号:
      24651168
    • 项目类别:
      Grant-in-Aid for Challenging Exploratory Research
    • 资助金额:
      $2.58万
    • 财政年份:
      2012
    • 负责人:
      IKEDA Hiroya
    • 依托单位:
    High-efficiency thermoelectric devices with Si nanostructures and their measurement techniques
    • 批准号:
      21360336
    • 项目类别:
      Grant-in-Aid for Scientific Research (B)
    • 资助金额:
      $11.15万
    • 财政年份:
      2009
    • 负责人:
      IKEDA Hiroya
    • 依托单位:
    Development of high-efficiency thermoelectric module using Si nanowier structures
    • 批准号:
      19560701
    • 项目类别:
      Grant-in-Aid for Scientific Research (C)
    • 资助金额:
      $2.91万
    • 财政年份:
      2007
    • 负责人:
      IKEDA Hiroya
    • 依托单位:
    海外基金