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Evaluation of mechanical & electrical properties of Nanowires Used for Nano Mechanical Sensors Using Functional MEMS Device

Evaluation of mechanical & electrical properties of Nanowires Used for Nano Mechanical Sensors Using Functional MEMS Device
机械性能评价
批准号:
20360060
负责人:
ISONO Yoshitada
金额:
$12.56万
依托单位:
依托单位国家:
日本
项目类别:
Grant-in-Aid for Scientific Research (B)
财政年份:
2008
资助国家:
日本
项目状态:
已结题
起止时间:
2008 至 2010

项目摘要

项目成果

ISONO Yoshitada的其他基金

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中文摘要
翻译
本研究开发了原位扫描电子显微镜(SEM)纳米材料测试系统,以揭示碳纳米管(CNTs)的力学和电学性能,开发新型纳米力学传感器。原位SEM测试系统由静电驱动纳米拉伸试验装置(EANAT)和纳米探针操作系统组成。EANAT可以测量单轴拉伸纳米材料的伸长率通过电容传感器集成到EANAT的紫菜运动放大系统。传感分辨率为0.93nm。在EANAT上测试了通过热CVD制备的直径为51 nm的多壁CNT。在测试中得到的应力-应变关系阐明了CNT的断裂机制。在碳纳米管的断裂过程中,碳纳米管的一对外壳在第一步断裂,而另一个内芯则跟随外壳断裂。CNT的杨氏模量为约600 GPa,这与先前报道的值大致相同。
英文摘要
This research developed the in situ scanning electron microscopy (SEM) nanomaterial testing system to reveal mechanical & electrical properties of carbon nanotubes (CNTs) for developing novel nano mechanical sensors. The in situ SEM testing system is constituted of Electrostatically Actuated NAno Tensile testing devices (EANATs) and the nano probe manipulation system. The EANATs can measure uniaxial tensile elongation of nanomaterials by the capacitance sensor integrated into the laver motion amplification system on the EANATs. The sensing resolution was 0.93 nm. The 51 nm-diametric multiwalled CNT prepared by the thermal CVD were tested on the EANATs. The stress-strain relation obtained in the test clarified the fracture mechanism of the CNT. In the fracture process of the CNT, a couple of outer shells of CNT have broken at the first step and the other inside core of the CNT followed the outer shells to failure. The Young's modulus of the CNT was about 600 GPa, which was roughly the same as previously reported values.
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MEMS機能デバイスによるナノ厚金薄膜の力学特性評価に関する研究
利用MEMS功能器件评价纳米厚金薄膜力学性能的研究
DOI: --
发表时间: 2010
期刊:
影响因子: --
作者: [呉衒珍, 磯野吉正]
通讯作者: 磯野吉正
Piezoresistance Effect of FIB Deposited Carbon Nanowires under Severe Strain
FIB沉积碳纳米线在强应变下的压阻效应
DOI: --
发表时间: 2008
期刊: Journal of Micromechanics and Microengineerings, Institute of Physics Vol.18, No.6
影响因子: --
作者: [Mario Kiuchi, Shinji Matsui, Yoshitada Isono]
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Strain Rate Dependence of Mechanical Properties for Sub 100nm-thick Au Film Using Electrostatically Actuated Nano Tensile Testing Device
使用静电驱动纳米拉伸测试装置研究亚 100 纳米厚金膜机械性能的应变率依赖性
DOI: --
发表时间: 2011
期刊:
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作者: [Hyun-Jin Oh, Itsuo Hanasaki, Yoshitada Isono, Seung-Woo Han, Hak-Joo Lee]
通讯作者: Hak-Joo Lee
STRAIN RATE DEPENDENCE OF MECHANICAL PROPERTIES FOR SUB 100 NM-THICK AU FILM USING ELECTROSTATICALLY ACTUATED NANO TENSILE TESTING DEVICE
使用静电驱动纳米拉伸测试设备测量厚度低于 100 nm 的 AU 薄膜的机械性能的应变率依赖性
DOI: --
发表时间: 2011
期刊:
影响因子: --
作者: [Hyun-Jin Ohl, Itsuo Hanasaki, Yoshitada Isono, Seung-Woo Han, Hak-Joo Lee]
通讯作者: Hak-Joo Lee
Synthesis of silicon nanowires using protein and gold nanoparticles for development of thermoelectric conversion device
  • 批准号:
    25630093
  • 项目类别:
    Grant-in-Aid for Challenging Exploratory Research
  • 资助金额:
    $2.58万
  • 财政年份:
    2013
  • 负责人:
    ISONO Yoshitada
  • 依托单位:
Evaluation of mechanical-electrical coupled properties for single crystal silicon nanowires using MEMS
  • 批准号:
    24360046
  • 项目类别:
    Grant-in-Aid for Scientific Research (B)
  • 资助金额:
    $12.06万
  • 财政年份:
    2012
  • 负责人:
    ISONO Yoshitada
  • 依托单位:
Evaluation of Mechanical Properties for Nanometric Silicon Wire Used for Single Electron
  • 批准号:
    13555030
  • 项目类别:
    Grant-in-Aid for Scientific Research (B)
  • 资助金额:
    $8.32万
  • 财政年份:
    2001
  • 负责人:
    ISONO Yoshitada
  • 依托单位:
Mechanical Characterization of Ni-Based Alloy Thin Film by SPM Tensile Testing
  • 批准号:
    13650106
  • 项目类别:
    Grant-in-Aid for Scientific Research (C)
  • 资助金额:
    $2.56万
  • 财政年份:
    2001
  • 负责人:
    ISONO Yoshitada
  • 依托单位:
海外基金