High growth-rate hydride-vapor-phase of aluminum nitride

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AlN is an attractive substrate for short-wavelength optoelectronics devices based on AlGaN. For growth of AlN and AlGaN, lateral overgrowth using a patterned substrate is useful for control of dislocation penetration, because selective-area growth with masks, such as SiO2, cannot be applied. In this study, thick AlN films were grown by HVPE on AlN/sapphire stripe patterned seeds with triangular shape in cross section, and the TDs density on the surface of HVPE-grown films was reduced one order of magnitude from a AlN film without pattern seeds. We also have investigated threading dislocations(TDs) in epitaxial AlN films by etch-pit method. Epitaxial AlN films were etched by mixed acid solution(KOH+ NaOH). The etch-pits were classified into TD groups by those sizes.