Study on robust circuit design techniques based on physical parameters of semiconductor devices and its Applications

在这项研究中，我们开发了模拟和数字电路设计技术，是宽容的过程和温度变化。通过研制超低功耗电流基准源电路，实现了对各大规模集成电路中MOSFET阈值电压的监控。提出了利用片内变化监测电路对数字电路进行补偿的结构。此外，我们开发了强大的运算放大器和比较器电路，是基本的模拟电路构建模块。对于模拟和数字信号处理系统，时钟参考电路和模数转换器进行了研究。我们证明了这些电路对工艺和温度变化的鲁棒性。

In this study, we developed analog and digital circuit design techniques that are tolerant to process and temperature variations. By developing ultra-low power current reference circuit, we can monitor the condition of threshold voltage of MOSFET in each LSI chip. We also proposed compensation architecture of digital circuits by using on-chip variation monitoring circuit. Moreover, we developed robust operational amplifier and comparator circuit that are fundamental analog circuit building blocks. For analog and digital signal processing systems, clock reference circuit and analog-digital converter were investigated. We demonstrated that these circuits operate robustly against process and temperature variations.