EXCITATION WAVELENGTH DEPENDENT RAMAN SPECTROSCOPY OF ARTERY

激发波长相关的动脉拉曼光谱

• 批准号: 6314204
• 负责人: JASON MOTZ
• 金额: $ 1.38万
• 依托单位: MASSACHUSETTS INSTITUTE OF TECHNOLOGY
• 依托单位国家: 美国
• 财政年份: 2000
• 资助国家: 美国
• 起止时间: 2000-06-01 至 2001-05-31
• 项目状态: 已结题
• 来源: https://reporter.nih.gov/project-details/6314204
• 关键词: biomedical equipment development; biomedical resource; cardiovascular system; human tissue; spectrometry; technology /technique

The goal of this project is to compare the performance of 785 nm and 830 nm based Raman spectroscopy for quantitative analysis of artery. Silicon based charge coupled device (CCD) detectors have low dark current and high quantum efficiency in the short wavelength region offering shot noise limited detection. In addition, standard diode lasers, holographic notch filters, efficient spectrographs and filtered optical fiber probes are readily available for 785 nm laser excitaion, often at economical pricing compared to those used in 830 nm laser excited Raman spectroscopy. However, biological tissue exhibits marked fluorescence with short wavelength (for e.g. 785 nm) NIR stimulation. Our current research has found that the shot noise generated by the fluorescence background signal to be prohibitive to artery disease analysis using 785 nm-excited Raman spectroscopy. We have also shown that longer wavelength excitation indeed affords sufficient reduction in fluorescence background and thus reduced shot noise to overcome present detection equipment limitations. Thus, it was shown that 830nm wavelength excitation is an optimal compromise between currently available technology and practical fundamental limitations, in accord with our previous work.

该项目的目标是比较785 nm的性能 和830 nm的拉曼光谱定量分析 动脉 基于硅的电荷耦合器件（CCD）检测器具有低的 暗电流和短波长下的高量子效率 提供散粒噪声有限检测的区域。 此外，标准 二极管激光器，全息陷波滤波器，高效光谱仪， 对于785 nm激光，可随时获得过滤光纤探头 激励，通常与830中使用的激励相比， nm激光激发拉曼光谱。 然而，生物组织 在短波长（例如785 nm）下显示出显著的荧光 NIR刺激。 我们目前的研究发现散粒噪声 所产生的荧光背景信号是禁止的， 使用785 nm激发的拉曼光谱分析动脉疾病。 我们 还表明，较长波长的激发确实提供了 荧光背景的充分减少，从而减少了发射 噪声，以克服现有检测设备的局限性。 因此 结果表明，830nm波长激发是最佳折衷 现有技术和实际基础之间的差距 与我们以前的工作相雅阁。