New Geometrical Filtration for Ultra-Precision and Micro/Nano Manufactured Products
适用于超精密和微/纳米制造产品的新型几何过滤
基本信息
- 批准号:EP/F032242/1
- 负责人:
- 金额:$ 26.27万
- 依托单位:
- 依托单位国家:英国
- 项目类别:Research Grant
- 财政年份:2008
- 资助国家:英国
- 起止时间:2008 至 无数据
- 项目状态:已结题
- 来源:
- 关键词:
项目摘要
In the last decade, the design and fabrication of high value, micro- and nanoscale devices (in photonics, telecommunication, aerospace, automotive, defence, biotech, medical and consumer applications) has gradually moved from academic research to industrial manufacturing sectors. Enabling technologies such as computing design technology and ultra-precision and micro/nano- manufacturing capabilities have facilitated the design of these components. However, a fundamental barrier to achieving the potential growth of these products is in providing the metrological infrastructure to measure and characterise these components with the required accuracy so that their manufacturing quality can be controlled. Enterprises that achieve high levels of quality control will secure a larger market share.This proposed two-year project attempts to provide tools to enable the geometrical characterisation of these ultra precision and micro/nano-scale products. The project will develop novel non-linear geometrical filtration techniques. It will focus on robust approaches for micro/nano geometrical features that cope with deterministic engineered surface features/structures, create fast accurate algorithms (implementation in the manufacture context) and reference algorithms (for establishing traceability to national metrology standards) for non-linear filtration, together with best practice guidance for their implementation and use.The consortium for the proposed project is comprised of the Surface Metrology Group (SMG) at the University of Huddersfield, the National Physical Laboratory (NPL, the UK's national metrology institute) and the instrumentation manufacturer Taylor Hobson Limited (TH). The three partners together address the requirements for innovation, development of the national measurement infrastructure, with emphasis on validated algorithms and software, and industrial relevance and applicability. The research will enable UK industry to establish new quality control systems for high-tech products and support the mission of the government for high-added value manufacture: 60% shorter throughput time; 60% shorter time to market and 50% reduction in product costs.
在过去的十年中,高价值、微米和纳米级器件的设计和制造(在光子学、电信、航空航天、汽车、国防、生物技术、医疗和消费应用中)已逐渐从学术研究转向工业制造部门。计算设计技术和超精密以及微/纳米制造能力等使能技术促进了这些部件的设计。然而,实现这些产品潜在增长的一个根本障碍是提供计量基础设施,以便以所需的精度测量和表征这些部件,以便可以控制它们的制造质量。达到高质量控制水平的企业将获得更大的市场份额。这项拟议的两年项目试图提供工具,使这些超精密和微/纳米尺度的产品能够进行几何表征。该项目将开发新的非线性几何过滤技术。它将集中于处理确定性工程表面特征/结构的微/纳米几何特征的稳健方法,为非线性过滤创建快速准确的算法(在制造环境中实施)和参考算法(用于建立对国家计量标准的可追溯性),以及它们的实施和使用的最佳实践指导。拟议项目的联合体由哈德斯菲尔德大学表面计量组(SMG)、国家物理实验室(NPL,英国国家计量研究所)和仪器制造商Taylor Hobson Limited(TH)组成。这三个合作伙伴共同解决创新、发展国家测量基础设施的要求,重点是经过验证的算法和软件,以及行业相关性和适用性。这项研究将使英国工业能够为高科技产品建立新的质量控制体系,并支持政府对高附加值制造的使命:将产能时间缩短60%;将上市时间缩短60%,并将产品成本降低50%。
项目成果
期刊论文数量(9)
专著数量(0)
科研奖励数量(0)
会议论文数量(0)
专利数量(0)
A Fast Algorithm for the High Order Linear and Nonlinear Gaussian Regression filter
- DOI:
- 发表时间:2009-06
- 期刊:
- 影响因子:0
- 作者:W. Zeng;X. Jiang;P. Scott;S. Xiao;L. Blunt
- 通讯作者:W. Zeng;X. Jiang;P. Scott;S. Xiao;L. Blunt
robust solution for the stratified functional surfaces
分层功能表面的稳健解决方案
- DOI:
- 发表时间:
- 期刊:
- 影响因子:0
- 作者:Xiangqian Jiang (Author)
- 通讯作者:Xiangqian Jiang (Author)
A Fast Algorithm for the 2nd order Robust Areal Gaussian Regression filter
二阶鲁棒面积高斯回归滤波器的快速算法
- DOI:
- 发表时间:2010
- 期刊:
- 影响因子:0
- 作者:W Zeng
- 通讯作者:W Zeng
ISO/CD 16610-60 Geometrical product specifications (GPS) - Filtration - Part 60: Linear areal filters: Basic Concepts
ISO/CD 16610-60 几何产品规范 (GPS) - 过滤 - 第 60 部分:线性区域滤波器:基本概念
- DOI:
- 发表时间:
- 期刊:
- 影响因子:0
- 作者:James Flewellen (Creator)
- 通讯作者:James Flewellen (Creator)
ISO/TS 16610-21, Geometrical product specifications (GPS) - Filtration - Part 21: Linear profile filters: Gaussian filters
ISO/TS 16610-21,产品几何规范 (GPS) - 过滤 - 第 21 部分:线性轮廓滤波器:高斯滤波器
- DOI:
- 发表时间:
- 期刊:
- 影响因子:0
- 作者:Holger Schnädelbach (Creator)
- 通讯作者:Holger Schnädelbach (Creator)
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Xiangqian Jiang其他文献
DDAL: A Drift Detection Active Learning Mechanism
DDAL:漂移检测主动学习机制
- DOI:
10.1109/cbd63341.2023.00060 - 发表时间:
2023 - 期刊:
- 影响因子:0
- 作者:
Shuren Li;Weinan Wang;Xiangqian Jiang;Jun Hua;Jiawei Mao;Yibin Lu;Xuan Jia;Di Wang;Zhen Wang;Yifei Lu - 通讯作者:
Yifei Lu
Asymmetry robust centroid localization in confocal microscopy
共焦显微镜中的不对称鲁棒质心定位
- DOI:
10.1364/ol.455938 - 发表时间:
2022 - 期刊:
- 影响因子:3.6
- 作者:
Cheng Chen;Changchun Chai;Xiaojun Liu;Xiangqian Jiang;Wenlong Lu - 通讯作者:
Wenlong Lu
Minimum zone evaluation of the form errors of quadric surfaces
- DOI:
10.1016/j.precisioneng.2010.12.005 - 发表时间:
2011-04-01 - 期刊:
- 影响因子:
- 作者:
Xiangchao Zhang;Xiangqian Jiang;Paul J. Scott - 通讯作者:
Paul J. Scott
Chebyshev fitting of complex surfaces for precision metrology
用于精密计量的复杂表面切比雪夫拟合
- DOI:
10.1016/j.measurement.2013.04.017 - 发表时间:
2013-11 - 期刊:
- 影响因子:5.6
- 作者:
Hao Zhang;Xiaoying He;Min Xu;Xiangqian Jiang - 通讯作者:
Xiangqian Jiang
Adaptive Phase Correction for Phase Measuring Deflectometry Based on Light Field Modulation
基于光场调制的相位测量偏转的自适应相位校正
- DOI:
10.1109/tim.2021.3067954 - 发表时间:
2021 - 期刊:
- 影响因子:5.6
- 作者:
Zhenqi Niu;Xiangchao Zhang;Junqiang Ye;Lu Ye;Rui Zhu;Xiangqian Jiang - 通讯作者:
Xiangqian Jiang
Xiangqian Jiang的其他文献
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{{ truncateString('Xiangqian Jiang', 18)}}的其他基金
Future Advanced Metrology Hub - Additional Funding
未来先进计量中心 - 额外资金
- 批准号:
EP/X038513/1 - 财政年份:2022
- 资助金额:
$ 26.27万 - 项目类别:
Research Grant
Next Generation Metrology Driven by Nanophotonics
纳米光子学驱动的下一代计量
- 批准号:
EP/T02643X/1 - 财政年份:2021
- 资助金额:
$ 26.27万 - 项目类别:
Research Grant
EPSRC Centre for Innovative Manufacturing in Advanced Metrology
EPSRC 先进计量创新制造中心
- 批准号:
EP/I033424/1 - 财政年份:2011
- 资助金额:
$ 26.27万 - 项目类别:
Research Grant
A chip device for on-line assessment in nano-scale surface manufacture
一种用于纳米级表面制造在线评估的芯片装置
- 批准号:
EP/E03733X/1 - 财政年份:2007
- 资助金额:
$ 26.27万 - 项目类别:
Research Grant
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